Method for programming and/or testing for correct functioning of an electronic circuit

Proposed is a method for programming and/or testing for the correct functioning of an electronic circuit, and a corresponding device, which is used to efficiently program and test electronic circuits combined on a wafer, prior to their separation. For this purpose, a bus allowing the individual elec...

Full description

Saved in:
Bibliographic Details
Main Authors GIESEL RUEDIGER, HENNE RALF, SEIFERT DIETER, WOLF RENE
Format Patent
LanguageEnglish
Published 14.08.2007
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:Proposed is a method for programming and/or testing for the correct functioning of an electronic circuit, and a corresponding device, which is used to efficiently program and test electronic circuits combined on a wafer, prior to their separation. For this purpose, a bus allowing the individual electronic circuits to be sequentially tested is positioned on the wafer. Each electronic circuit is assigned an address for the bus, using a hardware code. The address is deactivated after completion of the functionality and testing method.
Bibliography:Application Number: US20030357658