Method for improving instrument response

This invention pertains generally to a method for improving the accuracy of particle analysis under conditions of discrete particle loading and particularly to a method for improving signal-to-noise ratio and instrument response in laser spark spectroscopic analysis of particulate emissions. Under c...

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Bibliographic Details
Main Authors FLOWER; WILLIAM L, HAHN; DAVID W, JOHNSEN; HOWARD A, HENCKEN; KENNETH R
Format Patent
LanguageEnglish
Published 09.05.2000
Edition7
Subjects
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Summary:This invention pertains generally to a method for improving the accuracy of particle analysis under conditions of discrete particle loading and particularly to a method for improving signal-to-noise ratio and instrument response in laser spark spectroscopic analysis of particulate emissions. Under conditions of low particle density loading (particles/m3) resulting from low overall metal concentrations and/or large particle size uniform sampling can not be guaranteed. The present invention discloses a technique for separating laser sparks that arise from sample particles from those that do not; that is, a process for systematically "gating" the instrument response arising from "sampled" particles from those responses which do not, is dislosed as a solution to his problem. The disclosed approach is based on random sampling combined with a conditional analysis of each pulse. A threshold value is determined for the ratio of the intensity of a spectral line for a given element to a baseline region. If the threshold value is exceeded, the pulse is classified as a "hit" and that data is collected and an average spectrum is generated from an arithmetic average of "hits". The true metal concentration is determined from the averaged spectrum.
Bibliography:Application Number: US19970956520