Logic performance verification and transition fault detection

• Main Authors: VINCENT; BRIAN J, CORR; JAMES L
• Format: Patent
• Language: English
• Published: 21.05.1991
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

In scan testing of logic parts, this invention provides an inexpensive transition fault test by changing the sequence of application of the A/C and B clocks. In each machine test cycle the B clock is triggered first, and the A/C clock is triggered second. The periodicity of the clocks is not changed...