Method of judging carrier lifetime in semiconductor devices

• Main Authors: IKEZI; HIROYUKI, FREEMAN; RICHARD L
• Format: Patent
• Language: English
• Published: 14.01.1986
• Edition: 4
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A method for judging whether a group of semiconductor devices have sufficiently short carrier lifetimes to make them suitable for use in high speed electronic circuitry. A determination is made as to the satisfactory carrier lifetime for a pn junction in the devices. A capacitance value representati...