Methods and apparatus for measuring variations in distance to a surface

The invention is especially suitable for profile measurements on non-specular surfaces. The surface of interest is intersected by projected interference fringes generated by two intersecting coherent light beams. The intersected fringes are imaged at a photo-electric detector having a sensitive cros...

Full description

Saved in:
Bibliographic Details
Main Authors REDMAN; JOHN D, WALL; MICHAEL R
Format Patent
LanguageEnglish
Published 13.02.1979
Subjects
Online AccessGet full text

Cover

Loading…
Abstract The invention is especially suitable for profile measurements on non-specular surfaces. The surface of interest is intersected by projected interference fringes generated by two intersecting coherent light beams. The intersected fringes are imaged at a photo-electric detector having a sensitive cross-sectional area relative to the fringe pitch, suitably half a fringe pitch, such as to produce an output variation if the fringes move relative to the detector. The phase of at least one of the beams is modulated to cause the fringes to shift laterally and cyclically across the surface, thereby causing the detector output to include a sinusoidal component whose phase depends on the distance to the imaged surface. The change in phase of this component, if and as the distance to the surface changes, is used to indicate the change in the distance.
AbstractList The invention is especially suitable for profile measurements on non-specular surfaces. The surface of interest is intersected by projected interference fringes generated by two intersecting coherent light beams. The intersected fringes are imaged at a photo-electric detector having a sensitive cross-sectional area relative to the fringe pitch, suitably half a fringe pitch, such as to produce an output variation if the fringes move relative to the detector. The phase of at least one of the beams is modulated to cause the fringes to shift laterally and cyclically across the surface, thereby causing the detector output to include a sinusoidal component whose phase depends on the distance to the imaged surface. The change in phase of this component, if and as the distance to the surface changes, is used to indicate the change in the distance.
Author REDMAN; JOHN D
WALL; MICHAEL R
Author_xml – fullname: REDMAN; JOHN D
– fullname: WALL; MICHAEL R
BookMark eNqFyjsOwjAMANAMMPA7A74AEihdGBHiszABc2U1DlgCO4pdzk8Hdqa3vGkYiQpNwulC_tRkgJIAS8GK3htkrfAmtL6yPOCDldFZxYAFEpujdASugDCUjB3Nwzjjy2jxcxaWx8Ntf15R0ZasDEXI2_u12cRtXDe7-H98AcEBNP8
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID US4139304A
GroupedDBID EVB
ID FETCH-epo_espacenet_US4139304A3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:28:19 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US4139304A3
Notes Application Number: US19770767334
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19790213&DB=EPODOC&CC=US&NR=4139304A
ParticipantIDs epo_espacenet_US4139304A
PublicationCentury 1900
PublicationDate 19790213
PublicationDateYYYYMMDD 1979-02-13
PublicationDate_xml – month: 02
  year: 1979
  text: 19790213
  day: 13
PublicationDecade 1970
PublicationYear 1979
RelatedCompanies NATIONAL RESEARCH DEVELOPMENT CORPORATION
RelatedCompanies_xml – name: NATIONAL RESEARCH DEVELOPMENT CORPORATION
Score 2.3445592
Snippet The invention is especially suitable for profile measurements on non-specular surfaces. The surface of interest is intersected by projected interference...
SourceID epo
SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Title Methods and apparatus for measuring variations in distance to a surface
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19790213&DB=EPODOC&locale=&CC=US&NR=4139304A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1LT8MwDLbGeN5gMI13Dqi3CtqubXqoEOuDCanbxDa029Q0mdiBbqId_H2cbAUuu-ZhxZYcf3ZsB-COcneWWp6tG6lp620jozrNuNAdjwnmuhkzhKxGTnpOd9x-mdiTGrxXtTCqT-i3ao6IGpWhvpfqvl7-BbFClVtZ3LM5Di0e45EfanxdLuZ6aLIsLez40aAf9gMtCPzxUOu9-nhXe-i5P-3ALoJoV-pC9NaRNSnL_wYlPoa9AdLKyxOoibwBh0H171oDDpLNc3cD9lV-Zlbg4EYHi1N4TtSnzwVJc07SperdvSoIgk_yoQJ-aIzIF7rA61gcmeeES5CIu0m5ICnBJTPk-Qxu42gUdHU82_RXDNPxsGLCakI9X-SiBWTmckRgFqM2R2xhUpY55gMSSakjPJPyc2hto3KxfeoSjqQwZXayYV1BvfxciWs0viW7UXL7AbK9ixc
link.rule.ids 230,309,783,888,25576,76882
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1LT8JAEJ4gPvCmKMEnezC9NdqWtttDY6QFUSkQaQ030u0ukYOF2KJ_3-kC6oXrPia7k8zMt7PzALih3J7GhmOqWqybalNLqEoTLlTLYYLZdsI0UWQjB32rGzWfx-a4BO-bXBhZJ_RbFkdEiUpQ3nOprxd_TixfxlZmt2yGQ_P7Tuj6Cl-li9kOmixD8VtuezjwB57ieW40UvqvLupqB1_uDzuwiwCbFr0O2m-tIidl8d-gdI5gb4i00vwYSiKtQsXb9F2rwkGw_u6uwr6Mz0wyHFzLYHYCj4Fs-pyROOUkXsja3cuMIPgkH9Lhh8aIfOETeOWLI7OU8AIk4m6Sz0lMcMkU73wKjU479Loqnm3yy4ZJNNpcwqhBOZ2nog5kanNEYAajJkdsoVOWWPodEompJRyd8jOob6Nyvn2qAZVuGPQmvaf-ywUcFowtIpU14xLK-edSXKEhztm15OEPYCCOBw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Methods+and+apparatus+for+measuring+variations+in+distance+to+a+surface&rft.inventor=REDMAN%3B+JOHN+D&rft.inventor=WALL%3B+MICHAEL+R&rft.date=1979-02-13&rft.externalDBID=A&rft.externalDocID=US4139304A