Image scanner for electron microscopes
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| Main Authors | , |
|---|---|
| Format | Patent |
| Language | English |
| Published |
28.08.1962
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| Subjects | |
| Online Access | Get full text |
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| Author | EINSTEIN PETER ALEX HAINE MICHAEL EDWARD |
|---|---|
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| Notes | Application Number: US19580776012 |
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| PublicationDecade | 1960 |
| PublicationYear | 1962 |
| RelatedCompanies | ASSOCIATED ELECTRICAL INDUSTRIES (MANCHESTER) LIMITED |
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| SubjectTerms | APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS TESTING |
| Title | Image scanner for electron microscopes |
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