SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

A semiconductor device includes electrode layers and first insulating films alternately stacked on top of one another; a second insulating film extending along an upper surface, a lower surface, and a side surface of one of electrode layers; a charge storage layer extending along a side surface of t...

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Main Authors NOGUCHI, Masaki, UMEDA, Chihiro, IINO, Tomohisa, NAKAJIMA, Yusuke, KAMIYA, Yuta, TAKASHIMA, Akira
Format Patent
LanguageEnglish
Published 22.08.2024
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Abstract A semiconductor device includes electrode layers and first insulating films alternately stacked on top of one another; a second insulating film extending along an upper surface, a lower surface, and a side surface of one of electrode layers; a charge storage layer extending along a side surface of the second insulating film with a third insulating film interposed therebetween; and a semiconductor layer extending along a side surface of the charge storage layer with a fourth insulating film interposed therebetween. A hydrogen concentration in the fourth insulating film is equal to or higher than a hydrogen concentration in the charge storage layer, which is equal to or higher than a hydrogen concentration in the third insulating film, which is equal to or higher than a hydrogen concentration in the second insulating film.
AbstractList A semiconductor device includes electrode layers and first insulating films alternately stacked on top of one another; a second insulating film extending along an upper surface, a lower surface, and a side surface of one of electrode layers; a charge storage layer extending along a side surface of the second insulating film with a third insulating film interposed therebetween; and a semiconductor layer extending along a side surface of the charge storage layer with a fourth insulating film interposed therebetween. A hydrogen concentration in the fourth insulating film is equal to or higher than a hydrogen concentration in the charge storage layer, which is equal to or higher than a hydrogen concentration in the third insulating film, which is equal to or higher than a hydrogen concentration in the second insulating film.
Author KAMIYA, Yuta
TAKASHIMA, Akira
NAKAJIMA, Yusuke
NOGUCHI, Masaki
UMEDA, Chihiro
IINO, Tomohisa
Author_xml – fullname: NOGUCHI, Masaki
– fullname: UMEDA, Chihiro
– fullname: IINO, Tomohisa
– fullname: NAKAJIMA, Yusuke
– fullname: KAMIYA, Yuta
– fullname: TAKASHIMA, Akira
BookMark eNrjYmDJy89L5WSwCnb19XT293MJdQ7xD1JwcQ3zdHZVcPRzUfB1DfHwd1FwA4r6OvqFujk6h4QGefq5K4R4uCoEO_q68jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjEyMLEzNzc0dDY-JUAQBiKSus
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID US2024284677A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2024284677A13
IEDL.DBID EVB
IngestDate Fri Sep 20 10:17:47 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2024284677A13
Notes Application Number: US202418443531
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240822&DB=EPODOC&CC=US&NR=2024284677A1
ParticipantIDs epo_espacenet_US2024284677A1
PublicationCentury 2000
PublicationDate 20240822
PublicationDateYYYYMMDD 2024-08-22
PublicationDate_xml – month: 08
  year: 2024
  text: 20240822
  day: 22
PublicationDecade 2020
PublicationYear 2024
RelatedCompanies Kioxia Corporation
RelatedCompanies_xml – name: Kioxia Corporation
Score 3.5575497
Snippet A semiconductor device includes electrode layers and first insulating films alternately stacked on top of one another; a second insulating film extending along...
SourceID epo
SourceType Open Access Repository
SubjectTerms ELECTRICITY
Title SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240822&DB=EPODOC&locale=&CC=US&NR=2024284677A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFPVNp-LHlIDSt-KWdu0qDOmSlCq0HWs79jbaLAVBuuEq_vsmYeqe9pbk4Lgc_O5yl9wF4NFzcCFto2PiggvTruzKLEpRmVW_ci2L97ij6yui2Alz-20-mLfg47cWRvcJ_dbNESWiuMR7o-31-j-JRfXbys1T-S6XVi9BNqLGNjpW_bowNuh4xCYJTYhByChPjXiqaVj5WteXsdKBPEi7Cg9sNlZ1KetdpxKcwuFE8qubM2iJugPH5PfvtQ4cRdsrbzncom9zDs-pUloS05xkyRRRNnslDPkxRRHLwoQiGdGhyI_zwCdZrp45oCxkKPUjdgEPActIaEohFn97XuTprsTWJbTrVS2uALl8IBzuLh3O-_bAXZbekHuW3RMWHi49XFxDdx-nm_3kWzhRU5U0xbgL7ebzS9xJr9uU91pZPy4WgBw
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1RS8MwED7GFOebTsXp1IDSt-KWdu0qDOmSlE7Xdqzt2NtosxYE6Yar-PdNyqZ72lvIwXE5-O5yl7sLwJNl4ETYRkPFCc9UPddzNUmzXM27ualpvMONqr_C8w031t_mvXkNPne9MNWc0J9qOKJAFBd4Lyt7vf5PYtGqtnLznH6IrdWrEw2oso2O5bwujBU6HLBJQAOiEDKIQ8WfVjQsfa1pi1jpSFyyTYkHNhvKvpT1vlNxzuB4IvgV5TnUsqIJDbL7e60JJ972yVsst-jbXMBLKJUW-DQmUTBFlM1GhCHbp8hjkRtQJCI65Nl-7NgkimWZA4pchkLbY5fw6LCIuKoQYvF35kUc7kusXUG9WBXZNSCT9zKDm0uD867eM5ep1eeWpncyDfeXFk5a0D7E6eYw-QEabuSNF-OR_34Lp5IkE6gYt6Fefn1nd8IDl-l9pbhfW7ODDw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SEMICONDUCTOR+DEVICE+AND+METHOD+FOR+MANUFACTURING+THE+SAME&rft.inventor=NOGUCHI%2C+Masaki&rft.inventor=UMEDA%2C+Chihiro&rft.inventor=IINO%2C+Tomohisa&rft.inventor=NAKAJIMA%2C+Yusuke&rft.inventor=KAMIYA%2C+Yuta&rft.inventor=TAKASHIMA%2C+Akira&rft.date=2024-08-22&rft.externalDBID=A1&rft.externalDocID=US2024284677A1