RESIN COMPOSITION FOR ENCAPSULATION AND SEMICONDUCTOR DEVICE
Provided are a resin composition for encapsulation that is superior in high-temperature reverse bias test (HTRB test) reliability; and a semiconductor device. The resin composition for encapsulation is used to encapsulate a power semiconductor element made of Si, SiC, GaN, Ga2O3 or diamond, and a cu...
Saved in:
Main Authors | , , , , |
---|---|
Format | Patent |
Language | English |
Published |
08.08.2024
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Provided are a resin composition for encapsulation that is superior in high-temperature reverse bias test (HTRB test) reliability; and a semiconductor device. The resin composition for encapsulation is used to encapsulate a power semiconductor element made of Si, SiC, GaN, Ga2O3 or diamond, and a cured product of the resin composition for encapsulation has a dielectric tangent of not larger than 0.50 when measured at 150° C. and 0.1 Hz. The semiconductor device is such that a power semiconductor element made of Si, SiC, GaN, Ga2O3 or diamond is encapsulated by the cured product of the resin composition for encapsulation. |
---|---|
Bibliography: | Application Number: US202418631187 |