TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

• Main Author: MAGGIONI, Flavio
• Format: Patent
• Language: English
• Published: 09.05.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A testing head apt to verify the operation of a device under test integrated on a semiconductor wafer includes a plurality of contact elements, each including a body that extends between a first end portion and a second end portion, and a guide provided with a plurality of guide holes apt to house t...