STRESS TEST FOR GROWN BAD BLOCKS

• Main Authors: Liu, Longju, Amin, Parth, Yuan, Jiahui, Islam, Sujjatul, Puthenthermadam, Sarath
• Format: Patent
• Language: English
• Published: 15.02.2024
• Subjects: INFORMATION STORAGE; PHYSICS; STATIC STORES

Technology is disclosed herein for detecting grown bad blocks in a non-volatile storage system. A stress test may accelerate stressful conditions on the memory cells and thereby provide for early detection of grown bad blocks. The stress test may include applying a program voltage to a selected word...