LITHOGRAPHY APPARATUS AND A METHOD OF MANUFACTURING A DEVICE

An immersion lithography apparatus controller configured to control a positioner to move a support table to follow an exposure route and to control a liquid confinement structure, the controller configured to: predict whether liquid will be lost from an immersion space during at least one motion of...

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Main Authors Bombeeck, John Maria, Melman, Johannes Cornelis Paulus, Lempens, Han Henricus Aldegonda, Cuypers, Koen, Vieyra Salas, Jorge Alberto, Debougnoux, Frank, Polet, Theodorus Wilhelmus, EUMMELEN, Erik Henricus Egidius Catharina, Gattobigio, Giovanni Luca
Format Patent
LanguageEnglish
Published 01.02.2024
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Abstract An immersion lithography apparatus controller configured to control a positioner to move a support table to follow an exposure route and to control a liquid confinement structure, the controller configured to: predict whether liquid will be lost from an immersion space during at least one motion of the route in which an edge of the object passes under an edge of the immersion space, and if liquid loss from the immersion space is predicted, modify the fluid flow such that a first fluid flow rate into or out of an opening at a leading edge of the liquid confinement structure is different to a second fluid flow rate into or out of an opening at a trailing edge of the liquid confinement structure during the motion of predicted liquid loss or a motion of the route subsequent to the motion of predicted liquid loss.
AbstractList An immersion lithography apparatus controller configured to control a positioner to move a support table to follow an exposure route and to control a liquid confinement structure, the controller configured to: predict whether liquid will be lost from an immersion space during at least one motion of the route in which an edge of the object passes under an edge of the immersion space, and if liquid loss from the immersion space is predicted, modify the fluid flow such that a first fluid flow rate into or out of an opening at a leading edge of the liquid confinement structure is different to a second fluid flow rate into or out of an opening at a trailing edge of the liquid confinement structure during the motion of predicted liquid loss or a motion of the route subsequent to the motion of predicted liquid loss.
Author Polet, Theodorus Wilhelmus
Melman, Johannes Cornelis Paulus
Vieyra Salas, Jorge Alberto
Debougnoux, Frank
Bombeeck, John Maria
EUMMELEN, Erik Henricus Egidius Catharina
Gattobigio, Giovanni Luca
Lempens, Han Henricus Aldegonda
Cuypers, Koen
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– fullname: Debougnoux, Frank
– fullname: Polet, Theodorus Wilhelmus
– fullname: EUMMELEN, Erik Henricus Egidius Catharina
– fullname: Gattobigio, Giovanni Luca
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Snippet An immersion lithography apparatus controller configured to control a positioner to move a support table to follow an exposure route and to control a liquid...
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SubjectTerms APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
Title LITHOGRAPHY APPARATUS AND A METHOD OF MANUFACTURING A DEVICE
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