METHOD FOR MICROSTRUCTURE MODIFICATION OF CONDUCTING LINES
A method for microstructure modification of conducting lines is provided. An electroplating process is performed to deposit the metal thin film/conducting line(s) with a face-centered cubic (FCC) structure and a preferred crystallographic orientation over a surface of a substrate. The metal thin fil...
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Format | Patent |
Language | English |
Published |
15.09.2022
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Abstract | A method for microstructure modification of conducting lines is provided. An electroplating process is performed to deposit the metal thin film/conducting line(s) with a face-centered cubic (FCC) structure and a preferred crystallographic orientation over a surface of a substrate. The metal thin film/ conducting line(s) is subsequently subjected to a thermal annealing process to modify its microstructure with the grain sizes in a range of 5 μm to 100 μm. The thermal annealing process is conducted at the temperature of above 25 degrees Celsius and below 240 degrees Celsius. |
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AbstractList | A method for microstructure modification of conducting lines is provided. An electroplating process is performed to deposit the metal thin film/conducting line(s) with a face-centered cubic (FCC) structure and a preferred crystallographic orientation over a surface of a substrate. The metal thin film/ conducting line(s) is subsequently subjected to a thermal annealing process to modify its microstructure with the grain sizes in a range of 5 μm to 100 μm. The thermal annealing process is conducted at the temperature of above 25 degrees Celsius and below 240 degrees Celsius. |
Author | LEE, Cheng Yu LIN, Ping Chou CHANG, Chih Hao HO, Cheng EN PAN, Chih Pin |
Author_xml | – fullname: PAN, Chih Pin – fullname: CHANG, Chih Hao – fullname: HO, Cheng EN – fullname: LIN, Ping Chou – fullname: LEE, Cheng Yu |
BookMark | eNrjYmDJy89L5WSw8nUN8fB3UXDzD1Lw9XQO8g8OCQp1DgkNclXw9XfxdPN0dgzx9PdT8HdTcPb3cwFKefq5K_h4-rkG8zCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjIyNLYxMzc0dDY-JUAQCNPiwE |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
ExternalDocumentID | US2022293467A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US2022293467A13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 14:50:00 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US2022293467A13 |
Notes | Application Number: US202117197965 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220915&DB=EPODOC&CC=US&NR=2022293467A1 |
ParticipantIDs | epo_espacenet_US2022293467A1 |
PublicationCentury | 2000 |
PublicationDate | 20220915 |
PublicationDateYYYYMMDD | 2022-09-15 |
PublicationDate_xml | – month: 09 year: 2022 text: 20220915 day: 15 |
PublicationDecade | 2020 |
PublicationYear | 2022 |
RelatedCompanies | YUAN ZE UNIVERSITY |
RelatedCompanies_xml | – name: YUAN ZE UNIVERSITY |
Score | 3.42706 |
Snippet | A method for microstructure modification of conducting lines is provided. An electroplating process is performed to deposit the metal thin film/conducting... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | APPARATUS THEREFOR BASIC ELECTRIC ELEMENTS CHEMISTRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROFORMING ELECTROLYTIC OR ELECTROPHORETIC PROCESSES METALLURGY PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS SEMICONDUCTOR DEVICES |
Title | METHOD FOR MICROSTRUCTURE MODIFICATION OF CONDUCTING LINES |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220915&DB=EPODOC&locale=&CC=US&NR=2022293467A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFPVNp-LHlIDSt-LW9VMo4pLWTmwztlb2Nto1BUG64Sr--15Dp3vaW5KDIzm4--WS-wC4t1I7E2bPQkUyDVUXIlUdxAHV6dl6ZqR2nsumfWFkBon-OjNmLfjc5MLIOqE_sjgiatQC9b2S9nr1_4jFZGzl-iH7wKXlkx-7TGm8Y01D-DMUNnS9MWecKpS6yVSJJpKGyIZm4Rl9pT28SFt1AJj3PqzzUlbboOIfw_4Y-ZXVCbRE2YFDuum91oGDsPnyxmGjfetTeAy9OOCMoONGUHoTPo0nCa3jFkjI2chvkoIJ9wnlEUPSKHohb3VfjTO4872YBipuYv535nky3d7x4Bza5bIUF0D6maP1i9S0hL3QhZY6jpUXhY52IjWKbKBdQncXp6vd5Gs4qqd1QETf6EK7-voWN4i6VXYrhfULXXR_9w |
link.rule.ids | 230,309,783,888,25578,76884 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFOebTsWPqQGlb8Wt66cwxCWtna7N2FrZ22i3FATphqv473sNne5pbyEHx-Xg7pdL7gPg3krsVJhtCw3JNFRdiER1EAdUp23rqZHYi4Uc2heEph_rr1NjWoPPTS2M7BP6I5sjokXN0d4L6a9X_49YTOZWrh_SD9xaPnlRjylVdKxpCH-Gwvo9d8QZpwqlvXiihGNJQ2RDt_CMsdIeXrLtstO--94v61JW26DiHcH-CPnlxTHURN6EBt3MXmvCQVB9eeOysr71CTwGbuRzRjBwI6i9MZ9E45iWeQsk4GzgVUXBhHuE8pAhaRC-kGE5V-MU7jw3or6KQsz-zjyLJ9sSd8-gni9zcQ6kkzpaJ0tMS9hzXWiJ41iLLNPRTyRGlna1C2jt4nS5m3wLDT8KhjMU7e0KDktSmRzRMVpQL76-xTUicJHeSMX9AoWKguc |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHOD+FOR+MICROSTRUCTURE+MODIFICATION+OF+CONDUCTING+LINES&rft.inventor=PAN%2C+Chih+Pin&rft.inventor=CHANG%2C+Chih+Hao&rft.inventor=HO%2C+Cheng+EN&rft.inventor=LIN%2C+Ping+Chou&rft.inventor=LEE%2C+Cheng+Yu&rft.date=2022-09-15&rft.externalDBID=A1&rft.externalDocID=US2022293467A1 |