METHOD FOR MICROSTRUCTURE MODIFICATION OF CONDUCTING LINES

A method for microstructure modification of conducting lines is provided. An electroplating process is performed to deposit the metal thin film/conducting line(s) with a face-centered cubic (FCC) structure and a preferred crystallographic orientation over a surface of a substrate. The metal thin fil...

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Main Authors PAN, Chih Pin, CHANG, Chih Hao, HO, Cheng EN, LIN, Ping Chou, LEE, Cheng Yu
Format Patent
LanguageEnglish
Published 15.09.2022
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Abstract A method for microstructure modification of conducting lines is provided. An electroplating process is performed to deposit the metal thin film/conducting line(s) with a face-centered cubic (FCC) structure and a preferred crystallographic orientation over a surface of a substrate. The metal thin film/ conducting line(s) is subsequently subjected to a thermal annealing process to modify its microstructure with the grain sizes in a range of 5 μm to 100 μm. The thermal annealing process is conducted at the temperature of above 25 degrees Celsius and below 240 degrees Celsius.
AbstractList A method for microstructure modification of conducting lines is provided. An electroplating process is performed to deposit the metal thin film/conducting line(s) with a face-centered cubic (FCC) structure and a preferred crystallographic orientation over a surface of a substrate. The metal thin film/ conducting line(s) is subsequently subjected to a thermal annealing process to modify its microstructure with the grain sizes in a range of 5 μm to 100 μm. The thermal annealing process is conducted at the temperature of above 25 degrees Celsius and below 240 degrees Celsius.
Author LEE, Cheng Yu
LIN, Ping Chou
CHANG, Chih Hao
HO, Cheng EN
PAN, Chih Pin
Author_xml – fullname: PAN, Chih Pin
– fullname: CHANG, Chih Hao
– fullname: HO, Cheng EN
– fullname: LIN, Ping Chou
– fullname: LEE, Cheng Yu
BookMark eNrjYmDJy89L5WSw8nUN8fB3UXDzD1Lw9XQO8g8OCQp1DgkNclXw9XfxdPN0dgzx9PdT8HdTcPb3cwFKefq5K_h4-rkG8zCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjIyNLYxMzc0dDY-JUAQCNPiwE
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID US2022293467A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2022293467A13
IEDL.DBID EVB
IngestDate Fri Jul 19 14:50:00 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2022293467A13
Notes Application Number: US202117197965
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220915&DB=EPODOC&CC=US&NR=2022293467A1
ParticipantIDs epo_espacenet_US2022293467A1
PublicationCentury 2000
PublicationDate 20220915
PublicationDateYYYYMMDD 2022-09-15
PublicationDate_xml – month: 09
  year: 2022
  text: 20220915
  day: 15
PublicationDecade 2020
PublicationYear 2022
RelatedCompanies YUAN ZE UNIVERSITY
RelatedCompanies_xml – name: YUAN ZE UNIVERSITY
Score 3.42706
Snippet A method for microstructure modification of conducting lines is provided. An electroplating process is performed to deposit the metal thin film/conducting...
SourceID epo
SourceType Open Access Repository
SubjectTerms APPARATUS THEREFOR
BASIC ELECTRIC ELEMENTS
CHEMISTRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
ELECTROFORMING
ELECTROLYTIC OR ELECTROPHORETIC PROCESSES
METALLURGY
PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS
SEMICONDUCTOR DEVICES
Title METHOD FOR MICROSTRUCTURE MODIFICATION OF CONDUCTING LINES
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220915&DB=EPODOC&locale=&CC=US&NR=2022293467A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFPVNp-LHlIDSt-LW9VMo4pLWTmwztlb2Nto1BUG64Sr--15Dp3vaW5KDIzm4--WS-wC4t1I7E2bPQkUyDVUXIlUdxAHV6dl6ZqR2nsumfWFkBon-OjNmLfjc5MLIOqE_sjgiatQC9b2S9nr1_4jFZGzl-iH7wKXlkx-7TGm8Y01D-DMUNnS9MWecKpS6yVSJJpKGyIZm4Rl9pT28SFt1AJj3PqzzUlbboOIfw_4Y-ZXVCbRE2YFDuum91oGDsPnyxmGjfetTeAy9OOCMoONGUHoTPo0nCa3jFkjI2chvkoIJ9wnlEUPSKHohb3VfjTO4872YBipuYv535nky3d7x4Bza5bIUF0D6maP1i9S0hL3QhZY6jpUXhY52IjWKbKBdQncXp6vd5Gs4qqd1QETf6EK7-voWN4i6VXYrhfULXXR_9w
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFOebTsWPqQGlb8Wt66cwxCWtna7N2FrZ22i3FATphqv473sNne5pbyEHx-Xg7pdL7gPg3krsVJhtCw3JNFRdiER1EAdUp23rqZHYi4Uc2heEph_rr1NjWoPPTS2M7BP6I5sjokXN0d4L6a9X_49YTOZWrh_SD9xaPnlRjylVdKxpCH-Gwvo9d8QZpwqlvXiihGNJQ2RDt_CMsdIeXrLtstO--94v61JW26DiHcH-CPnlxTHURN6EBt3MXmvCQVB9eeOysr71CTwGbuRzRjBwI6i9MZ9E45iWeQsk4GzgVUXBhHuE8pAhaRC-kGE5V-MU7jw3or6KQsz-zjyLJ9sSd8-gni9zcQ6kkzpaJ0tMS9hzXWiJ41iLLNPRTyRGlna1C2jt4nS5m3wLDT8KhjMU7e0KDktSmRzRMVpQL76-xTUicJHeSMX9AoWKguc
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHOD+FOR+MICROSTRUCTURE+MODIFICATION+OF+CONDUCTING+LINES&rft.inventor=PAN%2C+Chih+Pin&rft.inventor=CHANG%2C+Chih+Hao&rft.inventor=HO%2C+Cheng+EN&rft.inventor=LIN%2C+Ping+Chou&rft.inventor=LEE%2C+Cheng+Yu&rft.date=2022-09-15&rft.externalDBID=A1&rft.externalDocID=US2022293467A1