PLASMA IGNITION OPTIMIZATION IN SEMICONDUCTOR PROCESSING CHAMBERS

A method of reducing reflected Radio Frequency (RF) power in substrate processing chambers may include accessing input parameters for a processing chamber that are derived from a recipe to perform a process on a substrate. The input parameters may be provided to a model that has been trained using p...

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Bibliographic Details
Main Authors Schatz, Kenneth D, Jung, Soonwook
Format Patent
LanguageEnglish
Published 26.05.2022
Subjects
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