SYSTEMS AND METHODS FOR A FAST NEAR-FIELD ELECTROMAGNETIC SIMULATION METHODOLOGY FOR SIDE-CHANNEL EMISSION ANALYSIS

• Main Authors: Chang, Norman, Lu, Yu, Zhu, Deqi, Lin, Lang, Selvakumaran, Dinesh Kumar
• Format: Patent
• Language: English
• Published: 24.02.2022
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC COMMUNICATION TECHNIQUE; ELECTRIC DIGITAL DATA PROCESSING; ELECTRICITY; PHYSICS; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION

Methods, machine readable media and systems for near-field electromagnetic simulation for side-channel emission analysis of an integrated circuit (IC) are described. In one embodiment, a method can include the following operations: simulating EM field strengths for a plurality of grid partitions of a circuit area of the IC based on a cryptographic work load applied to a model of the IC; identifying one or more of the grid partitions as a security sensitive region for the IC based on the EM field strengths, wherein one or more grid partitions outside of the security sensitive region are identified as non-security sensitive regions for the IC; and simulating EM fields for the IC to perform the EM side-channel emission analysis, wherein contributions of the EM fields from the non-security sensitive regions for the EM side-channel emission analysis are based on a linear superposition of wire currents in the non-security sensitive regions of the IC.