PLASMA CLEANING METHODS FOR PROCESSING CHAMBERS

Embodiments of the present disclosure generally relate to clean methods for processing chambers, and more specifically relate to plasma clean methods for removing carbon films from surfaces within the processing chamber. A method for cleaning includes introducing a cleaning gas into a processing reg...

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Main Authors VENKATASUBRAMANIAN, Eswaranand, PINSON, II, Jay D, ALAYAVALLI, Kaushik, WANG, Huiyuan, KUSTRA, Rick, MALLICK, Abhijit B
Format Patent
LanguageEnglish
Published 09.12.2021
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Summary:Embodiments of the present disclosure generally relate to clean methods for processing chambers, and more specifically relate to plasma clean methods for removing carbon films from surfaces within the processing chamber. A method for cleaning includes introducing a cleaning gas into a processing region within a processing chamber, where interior surfaces of the processing chamber have a coating containing amorphous carbon. The cleaning gas contains oxygen gas and a noble gas. The method also includes generating an ion coupled plasma (ICP) from the cleaning gas within an upper portion of the processing region and generating a bias across a substrate support in a lower portion of the processing region. The method further includes exposing the amorphous carbon to atomic oxygen ions produced from the oxygen gas and the ICP and removing the amorphous carbon from the interior surfaces with the atomic oxygen ions during a cleaning process.
Bibliography:Application Number: US202016896575