SUBSTRATE INSPECTION APPARATUS AND METHOD OF DETERMINING FAULT TYPE OF SCREEN PRINTER

A substrate inspection apparatus generates, when anomalies of a plurality of second solder pastes among a plurality of first solder pastes printed on a first substrate is detected, at least one image indicating a plurality of second solder pastes with anomalies detected by using an image about a fir...

Full description

Saved in:
Bibliographic Details
Main Authors LEE, Seung Jae, CHOI, Tae Min, KIM, Jong Hwan, PARK, Juyoun, PARK, Jin Man, HWANG, Ye Won, YOO, Yong Ho, LEE, Duk Young
Format Patent
LanguageEnglish
Published 18.11.2021
Subjects
Online AccessGet full text

Cover

Loading…
Abstract A substrate inspection apparatus generates, when anomalies of a plurality of second solder pastes among a plurality of first solder pastes printed on a first substrate is detected, at least one image indicating a plurality of second solder pastes with anomalies detected by using an image about a first substrate, applies the at least one image to a machine-learning-based model, acquires a plurality of first values indicating relevance of respective first fault types to the at least one image and a plurality of first images indicating regions associated with one of a plurality of first fault types, determines a plurality of second fault types, which are associated with the plurality of second solder pastes by using the plurality of first values and the plurality of first images, and determines at least one third solder paste, which is associated with the respective second fault types.
AbstractList A substrate inspection apparatus generates, when anomalies of a plurality of second solder pastes among a plurality of first solder pastes printed on a first substrate is detected, at least one image indicating a plurality of second solder pastes with anomalies detected by using an image about a first substrate, applies the at least one image to a machine-learning-based model, acquires a plurality of first values indicating relevance of respective first fault types to the at least one image and a plurality of first images indicating regions associated with one of a plurality of first fault types, determines a plurality of second fault types, which are associated with the plurality of second solder pastes by using the plurality of first values and the plurality of first images, and determines at least one third solder paste, which is associated with the respective second fault types.
Author YOO, Yong Ho
KIM, Jong Hwan
PARK, Jin Man
CHOI, Tae Min
PARK, Juyoun
LEE, Duk Young
LEE, Seung Jae
HWANG, Ye Won
Author_xml – fullname: LEE, Seung Jae
– fullname: CHOI, Tae Min
– fullname: KIM, Jong Hwan
– fullname: PARK, Juyoun
– fullname: PARK, Jin Man
– fullname: HWANG, Ye Won
– fullname: YOO, Yong Ho
– fullname: LEE, Duk Young
BookMark eNqNissKwjAQAHPQg69_WPAs2BYVj7HZ2IDdhGRz8FSKxJO0hfr_WMEP8DQwM0sx6_ouLUQM8RLYS0YwFByWbCyBdE5OLgaQpKBGrqwCq0Eho68NGbqClvHGwHeH3xJKj0jgvKFpWYv5s32NafPjSmw1clnt0tA3aRzaR-rSu4kh3-dZcTgdz4XMiv-uD4YvM1o
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID US2021357693A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2021357693A13
IEDL.DBID EVB
IngestDate Fri Jul 19 14:00:20 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2021357693A13
Notes Application Number: US202016960446
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211118&DB=EPODOC&CC=US&NR=2021357693A1
ParticipantIDs epo_espacenet_US2021357693A1
PublicationCentury 2000
PublicationDate 20211118
PublicationDateYYYYMMDD 2021-11-18
PublicationDate_xml – month: 11
  year: 2021
  text: 20211118
  day: 18
PublicationDecade 2020
PublicationYear 2021
RelatedCompanies KOH YOUNG TECHNOLOGY INC
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
RelatedCompanies_xml – name: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
– name: KOH YOUNG TECHNOLOGY INC
Score 3.3633149
Snippet A substrate inspection apparatus generates, when anomalies of a plurality of second solder pastes among a plurality of first solder pastes printed on a first...
SourceID epo
SourceType Open Access Repository
SubjectTerms CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
Title SUBSTRATE INSPECTION APPARATUS AND METHOD OF DETERMINING FAULT TYPE OF SCREEN PRINTER
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211118&DB=EPODOC&locale=&CC=US&NR=2021357693A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_G_HzTqUydElD6NnTrx7aHIV2Tuolry9rIfBpNm4Eg3XAV_30vYdM97SWQuxLSwOXyS353B3DfylPhpPOs6bR7TtNSL4Uiy3vYmO1OZgtpSc3yDZwht16m9rQCn5tYGJ0n9EcnR0SLytDeS71fL_8vsajmVq4exAeKFk9-0qfGGh231QbQNeigz6KQhp7heX0eG8FE60xbFf5zESvt4UG6o-yBvQ1UXMpy26n4J7Af4XhFeQoVWdTgyNvUXqvB4Xj95F2DA83RzFYoXNvh6gx4zAeq2nHCCKLviGkmCHGjyEUZj4kbUDJmyTCkJPQJZXhmHY-CUfBMfJe_JiR5j5jSxN6EsYAoSgR-cg53Pku8YRNnOvtbmBmPt3_LvIBqsShkHYjzmPbQ18_nwpZWbtrdVCUG7GQSwY5ARHcJjV0jXe1WX8Ox6qqIvFa3AdXy61veoGsuxa1e0V9tjYqH
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8Qv_BNUeMHahPN3ojCPoAHYsbWOZR1C-sMPpF1jMTEDCIz_vteG1CeeOnDXdO0Ta7XX_u7O4D75jQVVjrLGlarazUM-VMosmkXG73VzkyRG7li-TLLT4yXsTmuwOc6FkblCf1RyRHRojK091Kd14v_RyxXcSuXD-IDRfMnj_dcbYWOW_IA6Ghuv0ej0A0dzXF6SayxkdLppiz8ZyNW2sVLdlvaA33ry7iUxaZT8Y5gL8LxivIYKnlRg6qzrr1Wg4Ng9eVdg33F0cyWKFzZ4fIEkjjpy2rHnBJE3xFVTBBiR5GNsiQmNnNJQLkfuiT0iEvxzhoM2IA9E89Ohpzw94hKTeyMKGVEUiKwyynceZQ7fgNnOvnbmEkSby5LP4OdYl7k50Csx7SLvn42E2ZuTHWzk8rEgO0sR7AjENFdQH3bSJfb1bdQ9XkwnAwH7PUKDqVKRuc1O3XYKb--82t006W4Ubv7Cxm6jXo
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SUBSTRATE+INSPECTION+APPARATUS+AND+METHOD+OF+DETERMINING+FAULT+TYPE+OF+SCREEN+PRINTER&rft.inventor=LEE%2C+Seung+Jae&rft.inventor=CHOI%2C+Tae+Min&rft.inventor=KIM%2C+Jong+Hwan&rft.inventor=PARK%2C+Juyoun&rft.inventor=PARK%2C+Jin+Man&rft.inventor=HWANG%2C+Ye+Won&rft.inventor=YOO%2C+Yong+Ho&rft.inventor=LEE%2C+Duk+Young&rft.date=2021-11-18&rft.externalDBID=A1&rft.externalDocID=US2021357693A1