Automated Measurement of Positional Accuracy in the Qualification of High-Accuracy Plotters

Systems and methods for assessing plotting device accuracy in aid of a process for qualifying plotter systems. The system and process involve an ideal (virtual) test pattern consisting of digital data defining a nominal grid augmented by geometric features (e.g., closed two-dimensional geometric sha...

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Bibliographic Details
Main Authors Lawton, Robert Michael, Jones, Lindsay Leigh Waite, Bosma, Craig S
Format Patent
LanguageEnglish
Published 28.10.2021
Subjects
CALCULATING
COMPUTING
COUNTING
PHYSICS
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