MEMORY SUB-SYSTEM SELF-TESTING OPERATIONS

• Main Authors: Benjamin, Keith A, Eckel, Nathan A
• Format: Patent
• Language: English
• Published: 08.07.2021
• Subjects: INFORMATION STORAGE; PHYSICS; STATIC STORES

A method includes requesting, by a component of a memory sub-system controller, control of a data path associated with a memory device coupleable to the controller. The method can include generating, by the component, data corresponding to an operation to test the memory device and causing, by the c...