BOTTOM ELECTRODE STRUCTURE AND METHOD OF FORMING THE SAME
A void-less bottom electrode structure is formed at least partially in a via opening having a small feature size and containing a conductive landing pad structure which is composed of a metal-containing seed layer that is subjected to a reflow anneal. A metal-containing structure is located on a top...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
10.12.2020
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Subjects | |
Online Access | Get full text |
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Summary: | A void-less bottom electrode structure is formed at least partially in a via opening having a small feature size and containing a conductive landing pad structure which is composed of a metal-containing seed layer that is subjected to a reflow anneal. A metal-containing structure is located on a topmost surface of the bottom electrode structure. The metal-containing structure may be composed of an electrically conductive metal-containing material or a material stack of electrically conductive metal-containing materials. In some embodiments, the bottom electrode and the metal-containing structure collectively provide a non-volatile memory device. |
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Bibliography: | Application Number: US201916436308 |