METHODS FOR PRODUCING A SILICON INGOT THAT INVOLVE MONITORING A MOVING AVERAGE OF THE INGOT NECK PULL RATE
Methods for producing monocrystalline silicon ingots in which the pull rate during neck growth is monitored are disclosed. A moving average of the pull rate may be calculated and compared to a target moving average to determine if dislocations were not eliminated and the neck is not suitable for pro...
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Format | Patent |
Language | English |
Published |
02.01.2020
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Abstract | Methods for producing monocrystalline silicon ingots in which the pull rate during neck growth is monitored are disclosed. A moving average of the pull rate may be calculated and compared to a target moving average to determine if dislocations were not eliminated and the neck is not suitable for producing an ingot main body suspended from the neck. |
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AbstractList | Methods for producing monocrystalline silicon ingots in which the pull rate during neck growth is monitored are disclosed. A moving average of the pull rate may be calculated and compared to a target moving average to determine if dislocations were not eliminated and the neck is not suitable for producing an ingot main body suspended from the neck. |
Author | Wu, Chun-Sheng Tsai, Feng-Chien Chen, Chi-Yung Sheu, Yeong-Ming Tseng, Hsien-Ta Lu, Zheng |
Author_xml | – fullname: Wu, Chun-Sheng – fullname: Tseng, Hsien-Ta – fullname: Chen, Chi-Yung – fullname: Lu, Zheng – fullname: Tsai, Feng-Chien – fullname: Sheu, Yeong-Ming |
BookMark | eNqNi70KgzAURjO0Q__e4ULnQqqLa4hXDY25ksSsIiUdSlHBvj-V1gfo9J0PztmzzTAOcceeNfqKcgcFWWgs5a1UpgQBTmklycDyyIOvhF8wkA4INRnlyf68msIXAlpRIlCxuLhWBuUNmlZrsMLjkW0f_WuOp3UP7Fygl9UlTmMX56m_xyG-u9YlPOGcJ1maiWv6n_UBo344dQ |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
ExternalDocumentID | US2020002838A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US2020002838A13 |
IEDL.DBID | EVB |
IngestDate | Fri Sep 06 06:14:18 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US2020002838A13 |
Notes | Application Number: US201816021948 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200102&DB=EPODOC&CC=US&NR=2020002838A1 |
ParticipantIDs | epo_espacenet_US2020002838A1 |
PublicationCentury | 2000 |
PublicationDate | 20200102 |
PublicationDateYYYYMMDD | 2020-01-02 |
PublicationDate_xml | – month: 01 year: 2020 text: 20200102 day: 02 |
PublicationDecade | 2020 |
PublicationYear | 2020 |
RelatedCompanies | Global Wafers Co., Ltd |
RelatedCompanies_xml | – name: Global Wafers Co., Ltd |
Score | 3.2488263 |
Snippet | Methods for producing monocrystalline silicon ingots in which the pull rate during neck growth is monitored are disclosed. A moving average of the pull rate... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE APPARATUS THEREFOR CHEMISTRY CRYSTAL GROWTH METALLURGY PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE REFINING BY ZONE-MELTING OF MATERIAL SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE SINGLE-CRYSTAL-GROWTH UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL |
Title | METHODS FOR PRODUCING A SILICON INGOT THAT INVOLVE MONITORING A MOVING AVERAGE OF THE INGOT NECK PULL RATE |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200102&DB=EPODOC&locale=&CC=US&NR=2020002838A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT4MwEG-WadQ3nRo_pmmi4Y24Lz72sBhWuoECJVDI3hbYINEYtjiM_75Hh7qnvV1716Ztcvfrtb0rQo9qN9FzPVnKFXjIAzVPhM7JipalCyUBq5lUwcmup1rR4GWmzBro4zcWRuQJ_RbJEUGjFqDvpbDX6_9DLFO8rdw8pW9QtXqe8JEp1d5xT6RIk8zxiPrMZEQiZBSFkhdseRWW6gb4SgewkdaqB2A0HldxKetdUJmcokMf-ivKM9TIihY6Jr9_r7XQkVtfeQNZa9_mHL27lFvMDDF4btgPmBkR25tiA4e2YxPmYSgxjrllcCBj5sQUg8m0OQu2ci6LBRHTwJhSzCYgS-tWHiWv2I8cBwcGpxfoYUI5sWQY9PxvjeZRuDvD_iVqFqsiu0JYgQ1asgTU7naXA0XvDLNhR8_ztL9QtVTLtWvU3tfTzX72LTqpiuJMotdGzfLzK7sDlC7Te7G4P3rhi-0 |
link.rule.ids | 230,309,783,888,25578,76884 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT4MwEG-WaZxvOjV-TG2i4Y24Lz72sBgGZeCAEihkbwtskGjMtjiM_75Hx3RPe7v22qZtcvfrXXtXhJ7lTqLmarIQS_AQ-3KecJkTJSVL51ICWjMpg5NdT7ai_ttUmtbQ5y4WhucJ_eHJEUGi5iDvBdfX638nlsHfVm5e0neoWr2abGgIlXXc5SnSBGM0JD41qC7o-jAKBS_Y8kosVTWwlY7gkK2WmfZJPCrjUtb7oGKeoWMfxlsW56iWLZuooe_-XmuiE7e68gaykr7NBfpwCbOoEWKw3LAfUCPSbW-MNRzajq1TD0OJMswsjQEZUycmGFSmzWiwbefSmBMxCbQxwdSEtqTq5RF9gv3IcXCgMXKJnkzCdEuESc_-9mgWhfsr7F2h-nK1zK4RluCAliwAtTudRV9S24Ns0FbzPO3NZSVVcuUGtQ6NdHuY_YgaFnOdmWN7kzt0WrK4f6LbQvXi6zu7B8Qu0ge-0b80Vo7d |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHODS+FOR+PRODUCING+A+SILICON+INGOT+THAT+INVOLVE+MONITORING+A+MOVING+AVERAGE+OF+THE+INGOT+NECK+PULL+RATE&rft.inventor=Wu%2C+Chun-Sheng&rft.inventor=Tseng%2C+Hsien-Ta&rft.inventor=Chen%2C+Chi-Yung&rft.inventor=Lu%2C+Zheng&rft.inventor=Tsai%2C+Feng-Chien&rft.inventor=Sheu%2C+Yeong-Ming&rft.date=2020-01-02&rft.externalDBID=A1&rft.externalDocID=US2020002838A1 |