MEASURING ASSEMBLY
A measuring assembly for measuring the contour of a workpiece has a measuring probe that is pivotably supported and deflectable about a first axis (measuring axis) in order to contact a surface of the workpiece, and has a second axis that is associated with the workpiece. The first axis and the seco...
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Main Author | |
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Format | Patent |
Language | English |
Published |
23.11.2017
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Subjects | |
Online Access | Get full text |
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