Apparatus and Method to Monitor Thermal Runaway in a Semiconductor Device

An apparatus and methods are provided that more accurately detect the onset of thermal runaway in a device and timely control it. According to one embodiment, changes in stand-by current and temperature of a transistor device are measured and are used to be compared to some thresholds to trigger the...

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Main Author ZHAO Sam Ziqun
Format Patent
LanguageEnglish
Published 05.01.2017
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Abstract An apparatus and methods are provided that more accurately detect the onset of thermal runaway in a device and timely control it. According to one embodiment, changes in stand-by current and temperature of a transistor device are measured and are used to be compared to some thresholds to trigger the device to respond before the onset thermal runaway. According to another embodiment, stand-by current is measured and is compared to some thresholds to trigger the device to respond before the onset thermal runaway.
AbstractList An apparatus and methods are provided that more accurately detect the onset of thermal runaway in a device and timely control it. According to one embodiment, changes in stand-by current and temperature of a transistor device are measured and are used to be compared to some thresholds to trigger the device to respond before the onset thermal runaway. According to another embodiment, stand-by current is measured and is compared to some thresholds to trigger the device to respond before the onset thermal runaway.
Author ZHAO Sam Ziqun
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Snippet An apparatus and methods are provided that more accurately detect the onset of thermal runaway in a device and timely control it. According to one embodiment,...
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SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Title Apparatus and Method to Monitor Thermal Runaway in a Semiconductor Device
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