Apparatus and Method to Monitor Thermal Runaway in a Semiconductor Device
An apparatus and methods are provided that more accurately detect the onset of thermal runaway in a device and timely control it. According to one embodiment, changes in stand-by current and temperature of a transistor device are measured and are used to be compared to some thresholds to trigger the...
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Format | Patent |
Language | English |
Published |
05.01.2017
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Abstract | An apparatus and methods are provided that more accurately detect the onset of thermal runaway in a device and timely control it. According to one embodiment, changes in stand-by current and temperature of a transistor device are measured and are used to be compared to some thresholds to trigger the device to respond before the onset thermal runaway. According to another embodiment, stand-by current is measured and is compared to some thresholds to trigger the device to respond before the onset thermal runaway. |
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AbstractList | An apparatus and methods are provided that more accurately detect the onset of thermal runaway in a device and timely control it. According to one embodiment, changes in stand-by current and temperature of a transistor device are measured and are used to be compared to some thresholds to trigger the device to respond before the onset thermal runaway. According to another embodiment, stand-by current is measured and is compared to some thresholds to trigger the device to respond before the onset thermal runaway. |
Author | ZHAO Sam Ziqun |
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Snippet | An apparatus and methods are provided that more accurately detect the onset of thermal runaway in a device and timely control it. According to one embodiment,... |
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SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
Title | Apparatus and Method to Monitor Thermal Runaway in a Semiconductor Device |
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