METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
There is provided an inspection system for inspecting a specimen, an inspection unit capable to operate in conjunction with an inspection machine unit, a die layout clipping unit, methods of inspecting a specimen, and a method of providing a die layout clip. The method of inspecting a specimen compr...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
29.09.2016
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Subjects | |
Online Access | Get full text |
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