METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

• Main Authors: BOEHM Adi, GOREN Zvi, BATIKOFF Amit
• Format: Patent
• Language: English
• Published: 29.09.2016
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

There is provided an inspection system for inspecting a specimen, an inspection unit capable to operate in conjunction with an inspection machine unit, a die layout clipping unit, methods of inspecting a specimen, and a method of providing a die layout clip. The method of inspecting a specimen compr...