LIGHT MEASURING APPARATUS EMPLOYING OPTICAL ELECTRIC FIELD ENHANCING DEVICE

Using an optical electric field enhancing device including a fine uneven structure made of gold formed on the front surface of a transparent substrate, illumination light of a wavelength in the range from 400 to 530 nm is applied at least to an analyte, positional information of the analyte is detec...

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Bibliographic Details
Main Authors YAMAZOE SHOGO, NAYA MASAYUKI, SHIOTA MEGUMI
Format Patent
LanguageEnglish
Published 16.07.2015
Subjects
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:Using an optical electric field enhancing device including a fine uneven structure made of gold formed on the front surface of a transparent substrate, illumination light of a wavelength in the range from 400 to 530 nm is applied at least to an analyte, positional information of the analyte is detected by a position detection unit disposed on the rear surface side of the optical electric field enhancing device, and excitation light is applied to the detected position by an excitation light application unit. Signal light emitted from the analyte when the excitation light is applied is detected from the rear surface side of the transparent substrate.
Bibliography:Application Number: US201514668500