SYSTEM AND METHOD FOR MULTI-SCANNER X-RAY INSPECTION

• Main Authors: MUENSTER MATTHIAS, DREISEITEL PIA, KOENIG SEBASTIAN
• Format: Patent
• Language: English
• Published: 25.12.2014
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A method of analyzing a target item utilizing multiple scanners is disclosed. The method can include providing an item comprising a material. The method can further include acquiring a first set of scan data associated with the item using a first scanner, and acquiring a second set of scan data associated with the item using a second scanner. The method can further include generating a first set of transform data from the first set of scan data, analyzing the first set of transform data to identify a subset of the first set of transform data associated with a first region, and analyzing the second set of scan data to identify a subset of the second set of scan data associated with a second region. The method can also include generating a measure that at least a portion of scan data is consistent with a presence of a candidate material in the item, where the portion of scan data is selected from at least one of the set consisting of: the subset of the first set of transform data and the subset of the second set of scan data.