SYSTEM AND METHOD FOR MULTI-SCANNER X-RAY INSPECTION
A method of analyzing a target item utilizing multiple scanners is disclosed. The method can include providing an item comprising a material. The method can further include acquiring a first set of scan data associated with the item using a first scanner, and acquiring a second set of scan data asso...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
25.12.2014
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Subjects | |
Online Access | Get full text |
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Abstract | A method of analyzing a target item utilizing multiple scanners is disclosed. The method can include providing an item comprising a material. The method can further include acquiring a first set of scan data associated with the item using a first scanner, and acquiring a second set of scan data associated with the item using a second scanner. The method can further include generating a first set of transform data from the first set of scan data, analyzing the first set of transform data to identify a subset of the first set of transform data associated with a first region, and analyzing the second set of scan data to identify a subset of the second set of scan data associated with a second region. The method can also include generating a measure that at least a portion of scan data is consistent with a presence of a candidate material in the item, where the portion of scan data is selected from at least one of the set consisting of: the subset of the first set of transform data and the subset of the second set of scan data. |
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AbstractList | A method of analyzing a target item utilizing multiple scanners is disclosed. The method can include providing an item comprising a material. The method can further include acquiring a first set of scan data associated with the item using a first scanner, and acquiring a second set of scan data associated with the item using a second scanner. The method can further include generating a first set of transform data from the first set of scan data, analyzing the first set of transform data to identify a subset of the first set of transform data associated with a first region, and analyzing the second set of scan data to identify a subset of the second set of scan data associated with a second region. The method can also include generating a measure that at least a portion of scan data is consistent with a presence of a candidate material in the item, where the portion of scan data is selected from at least one of the set consisting of: the subset of the first set of transform data and the subset of the second set of scan data. |
Author | DREISEITEL PIA KOENIG SEBASTIAN MUENSTER MATTHIAS |
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Snippet | A method of analyzing a target item utilizing multiple scanners is disclosed. The method can include providing an item comprising a material. The method can... |
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SubjectTerms | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
Title | SYSTEM AND METHOD FOR MULTI-SCANNER X-RAY INSPECTION |
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