METHOD AND DEVICE FOR MEASURING OPTICAL CHARACTERISTIC VARIABLES OF TRANSPARENT, SCATTERING MEASUREMENT OBJECTS

A method and device are provided for measurement of various transmission and reflection values of transparent measurement objects having transparent layers in an inline coating system, and particularly the turbidity of the measurement object during a relative movement between the measurement object...

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Main Authors PROEHL HOLGER, SCHOESSLER TINA, DIMER MARTIN, KNOTH THOMAS
Format Patent
LanguageEnglish
Published 19.07.2012
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Abstract A method and device are provided for measurement of various transmission and reflection values of transparent measurement objects having transparent layers in an inline coating system, and particularly the turbidity of the measurement object during a relative movement between the measurement object and measuring device. Transmission fractions are measured in two different radiation directions of a lighting source emitting diffuse light by two photodetectors, by which a fraction of diffuse light of the lighting source is suppressed in one direction.
AbstractList A method and device are provided for measurement of various transmission and reflection values of transparent measurement objects having transparent layers in an inline coating system, and particularly the turbidity of the measurement object during a relative movement between the measurement object and measuring device. Transmission fractions are measured in two different radiation directions of a lighting source emitting diffuse light by two photodetectors, by which a fraction of diffuse light of the lighting source is suppressed in one direction.
Author SCHOESSLER TINA
DIMER MARTIN
PROEHL HOLGER
KNOTH THOMAS
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KNOTH THOMAS
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Snippet A method and device are provided for measurement of various transmission and reflection values of transparent measurement objects having transparent layers in...
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SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title METHOD AND DEVICE FOR MEASURING OPTICAL CHARACTERISTIC VARIABLES OF TRANSPARENT, SCATTERING MEASUREMENT OBJECTS
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