METHOD FOR DETERMINING AND CORRECTING THE STABILITY OF RESPONSE OF A SEMI-CONDUCTOR MATRIX DETECTOR

Techniques for controlling a stability of response of a semi-conductor matrix imager composed of pixels, including a first phase of characterizing the stability of the pixels and a second phase of correcting the signals arising from the pixels during the measurements. The pixels are classed into sta...

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Main Authors GLASSER FRANCIS, VERGER LOICK
Format Patent
LanguageEnglish
Published 29.03.2012
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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Abstract Techniques for controlling a stability of response of a semi-conductor matrix imager composed of pixels, including a first phase of characterizing the stability of the pixels and a second phase of correcting the signals arising from the pixels during the measurements. The pixels are classed into stable pixels and unstable pixels according to a predetermined criterion, the unstable pixels being associated individually with a stable pixel whose characteristics serve as base for correcting signals arising from the unstable pixels.
AbstractList Techniques for controlling a stability of response of a semi-conductor matrix imager composed of pixels, including a first phase of characterizing the stability of the pixels and a second phase of correcting the signals arising from the pixels during the measurements. The pixels are classed into stable pixels and unstable pixels according to a predetermined criterion, the unstable pixels being associated individually with a stable pixel whose characteristics serve as base for correcting signals arising from the unstable pixels.
Author GLASSER FRANCIS
VERGER LOICK
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VERGER LOICK
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Snippet Techniques for controlling a stability of response of a semi-conductor matrix imager composed of pixels, including a first phase of characterizing the...
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SubjectTerms ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
Title METHOD FOR DETERMINING AND CORRECTING THE STABILITY OF RESPONSE OF A SEMI-CONDUCTOR MATRIX DETECTOR
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