SMART PROBE

The present system, method, article of manufacture, software, and apparatus is an "intelligent" probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error...

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Bibliographic Details
Main Authors MACFARLANE KEITH GEORGE, YORK FREDERICK JOHN, BARBER MARC, BRIGGS CLARK H
Format Patent
LanguageEnglish
Published 30.09.2010
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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