Integrated circuit package including wire bonds

It has been found that integrated packages having dies with at least 10 bonding pads separated by a pitch of 65 mum or less are susceptible to corrosion upon wire bonding to these pads and subsequent encapsulation in a passivating material. In particular, crevices are potentially formed between the...

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Main Authors OSENBACH JOHN WILLIAM, WEACHOCK RONALD JAMES, ANTOL JOZE EURA
Format Patent
LanguageEnglish
Published 16.04.2009
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Abstract It has been found that integrated packages having dies with at least 10 bonding pads separated by a pitch of 65 mum or less are susceptible to corrosion upon wire bonding to these pads and subsequent encapsulation in a passivating material. In particular, crevices are potentially formed between the bonding wire and bonding pad that are not passivated and that promote corrosion. Avoidance of crevice formation through, for example, appropriately choosing the bonding pad and wire configuration substantially avoids such corrosion.
AbstractList It has been found that integrated packages having dies with at least 10 bonding pads separated by a pitch of 65 mum or less are susceptible to corrosion upon wire bonding to these pads and subsequent encapsulation in a passivating material. In particular, crevices are potentially formed between the bonding wire and bonding pad that are not passivated and that promote corrosion. Avoidance of crevice formation through, for example, appropriately choosing the bonding pad and wire configuration substantially avoids such corrosion.
Author ANTOL JOZE EURA
OSENBACH JOHN WILLIAM
WEACHOCK RONALD JAMES
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Snippet It has been found that integrated packages having dies with at least 10 bonding pads separated by a pitch of 65 mum or less are susceptible to corrosion upon...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title Integrated circuit package including wire bonds
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