Error propagation control within integrated circuits

A method of selecting where error detection circuits should be placed within an integrated circuit uses simulation of a reference and test design with errors injected into the test design and then fan out analysis performed upon those injected errors to identify error propagation characteristics. Th...

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Bibliographic Details
Main Authors FLAUTNER KRISZTIAN, BLOME JASON ANDREW, BRADLEY DARYL WAYNE
Format Patent
LanguageEnglish
Published 19.02.2009
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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