Method for Detection and Scoring of Hot Spots in a Design Layout
A method for detection and scoring of hotspots in a design layout is provided. A plurality of indices is derived for a plurality of positions in the design layout. The plurality of indices comprises a first index sensitive to energy exposure of the design layout, a second index sensitive to process...
Saved in:
Main Authors | , , , , |
---|---|
Format | Patent |
Language | English |
Published |
15.11.2007
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | A method for detection and scoring of hotspots in a design layout is provided. A plurality of indices is derived for a plurality of positions in the design layout. The plurality of indices comprises a first index sensitive to energy exposure of the design layout, a second index sensitive to process image formation, and a third index sensitive to mask manufacturing error. The plurality of indices is then analyzed to identify at least one hotspot in the design layout. The at least one hotspot is then prioritized using an integrated hotspot scoring system. The integrated hotspot scoring system prioritizes hotspots based on a look-up table approach or an interpolation approach. |
---|---|
AbstractList | A method for detection and scoring of hotspots in a design layout is provided. A plurality of indices is derived for a plurality of positions in the design layout. The plurality of indices comprises a first index sensitive to energy exposure of the design layout, a second index sensitive to process image formation, and a third index sensitive to mask manufacturing error. The plurality of indices is then analyzed to identify at least one hotspot in the design layout. The at least one hotspot is then prioritized using an integrated hotspot scoring system. The integrated hotspot scoring system prioritizes hotspots based on a look-up table approach or an interpolation approach. |
Author | KU YAOING HOU CLIFF LIU RU-GUN LAI CHIH-MING SHIN IANG |
Author_xml | – fullname: LIU RU-GUN – fullname: SHIN IANG – fullname: LAI CHIH-MING – fullname: HOU CLIFF – fullname: KU YAOING |
BookMark | eNrjYmDJy89L5WRw8E0tychPUUjLL1JwSS1JTS7JzM9TSMxLUQhOzi_KzEtXyE9T8MgvUQguyC8pVsgEygHVFWem5yn4JFbml5bwMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAwNzIzMzYzMjR0Nj4lQBAA3lMrU |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
ExternalDocumentID | US2007266362A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US2007266362A13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 11:55:55 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US2007266362A13 |
Notes | Application Number: US20070682640 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071115&DB=EPODOC&CC=US&NR=2007266362A1 |
ParticipantIDs | epo_espacenet_US2007266362A1 |
PublicationCentury | 2000 |
PublicationDate | 20071115 |
PublicationDateYYYYMMDD | 2007-11-15 |
PublicationDate_xml | – month: 11 year: 2007 text: 20071115 day: 15 |
PublicationDecade | 2000 |
PublicationYear | 2007 |
RelatedCompanies | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD |
RelatedCompanies_xml | – name: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD |
Score | 2.6914127 |
Snippet | A method for detection and scoring of hotspots in a design layout is provided. A plurality of indices is derived for a plurality of positions in the design... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
Title | Method for Detection and Scoring of Hot Spots in a Design Layout |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071115&DB=EPODOC&locale=&CC=US&NR=2007266362A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bS8MwGP0Y8_qmVfEyJaD0rYi92PahqOuFInYbdpW9jabNYCBtsRniv_dLWHVPe80XQhI4OSfJ-RKAu7IoDLM0XA3lLtNMmusapbal6dRhJjKeUeoiOTkZPcaZ-TqzZj347HJh5Duh3_JxRERUgXjncr1u_g-xAumtbO_pEovqp2jqBWq3O7YRupYaDL1wMg7Gvur7Xpaqo3cZQy7C5foF90o7KKRtgYfwYyjyUppNUomOYHeC7VX8GHqsUuDA7_5eU2A_WV95K7AnPZpFi4VrHLYn8JzIj58JKk6CHZV2qorkVUnSQjrqSL0gcc1J2tS8JUuMYT3h1SBv-U-94qdwG4VTP9awU_O_OZhn6eYIjDPoV3XFzkXONWoo5jhumTMT2d-1mFkI1WPkD-WCOhcw2NbS5fbwFRzKw0zhe7MG0OdfK3aNLMzpjZy8X5uKibs |
link.rule.ids | 230,309,783,888,25576,76876 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1dS8MwFL2M-THfdCpTpwaUvhVxbW37MNS1K1XXbthO9jaaNoOBtMVmiP_em7DqnvaaG0ISODknybkJwG2WppqeabaKcpepOk16KqWmofaoxXRkPC3rieTkIHzwp_rrzJg14LPOhZHvhH7LxxERUSnincv1uvw_xHKlt7K6o0ssKh69uO8q9e7YROgaijvoDydjd-wojtOfRkr4LmPIRbhcP-NeaQdFtinwMPwYiLyUcpNUvEPYnWB7OT-CBsvb0HLqv9fasB-sr7zbsCc9mmmFhWscVsfwFMiPnwkqToIdlXaqnCR5RqJUOupIsSB-wUlUFrwiS4xhPeHVIKPkp1jxE7jxhrHjq9ip-d8czKfR5gi0U2jmRc46IucaNRSzLDtLmI7sbxtMT4Xq0ZL7bEGtM-hua-l8e_gaWn4cjOajl_DtAg7kwabwwBldaPKvFbtERub0Sk7kLz1ejK4 |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Method+for+Detection+and+Scoring+of+Hot+Spots+in+a+Design+Layout&rft.inventor=LIU+RU-GUN&rft.inventor=SHIN+IANG&rft.inventor=LAI+CHIH-MING&rft.inventor=HOU+CLIFF&rft.inventor=KU+YAOING&rft.date=2007-11-15&rft.externalDBID=A1&rft.externalDocID=US2007266362A1 |