Tri-gate low power device and method for manufacturing the same
The present invention provides a tri-gate lower power device and method for fabricating that tri-gate semiconductor device. The tri-gate device includes a first gate [ 455] located over a high voltage gate dielectric [ 465] within a high voltage region [ 460] , a second gate [ 435] located over a lo...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
29.09.2005
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Abstract | The present invention provides a tri-gate lower power device and method for fabricating that tri-gate semiconductor device. The tri-gate device includes a first gate [ 455] located over a high voltage gate dielectric [ 465] within a high voltage region [ 460] , a second gate [ 435] located over a low voltage gate dielectric [ 445] within a low voltage core region [ 440] and a third gate [ 475] located over an intermediate core oxide [ 485] within an intermediate core region [ 480] . One method of fabrication includes forming a high voltage gate dielectric layer [ 465] over a semiconductor substrate [ 415] , implanting a low dose of nitrogen [ 415 a] into the semiconductor substrate [ 415] in a low voltage core region [ 440] , and forming a core gate dielectric layer [ 445] over the low voltage core region [ 440] , including forming an intermediate core gate dielectric layer [ 485] over an intermediate core region [ 480]. |
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AbstractList | The present invention provides a tri-gate lower power device and method for fabricating that tri-gate semiconductor device. The tri-gate device includes a first gate [ 455] located over a high voltage gate dielectric [ 465] within a high voltage region [ 460] , a second gate [ 435] located over a low voltage gate dielectric [ 445] within a low voltage core region [ 440] and a third gate [ 475] located over an intermediate core oxide [ 485] within an intermediate core region [ 480] . One method of fabrication includes forming a high voltage gate dielectric layer [ 465] over a semiconductor substrate [ 415] , implanting a low dose of nitrogen [ 415 a] into the semiconductor substrate [ 415] in a low voltage core region [ 440] , and forming a core gate dielectric layer [ 445] over the low voltage core region [ 440] , including forming an intermediate core gate dielectric layer [ 485] over an intermediate core region [ 480]. |
Author | BREASHEARS EDDIE H TSAO ALWIN J ADAM LAHIR S |
Author_xml | – fullname: BREASHEARS EDDIE H – fullname: ADAM LAHIR S – fullname: TSAO ALWIN J |
BookMark | eNqNyrsKwjAUBuAMOnh7hwPOhTTSuYgo7ta5HJK_baC5kKT29V18AKdv-fZi44PHTrRdstXIBTSHlWJYkcjgYzWIvSGHMgVDQ0jk2C8D67Ik60cqEyizw1FsB54zTj8P4vy4d7dnhRh65MgaHqV_v5SUjaobqdS1vvy3vjZFMyA |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
Edition | 7 |
ExternalDocumentID | US2005215022A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US2005215022A13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 11:52:06 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US2005215022A13 |
Notes | Application Number: US20040810419 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050929&DB=EPODOC&CC=US&NR=2005215022A1 |
ParticipantIDs | epo_espacenet_US2005215022A1 |
PublicationCentury | 2000 |
PublicationDate | 20050929 |
PublicationDateYYYYMMDD | 2005-09-29 |
PublicationDate_xml | – month: 09 year: 2005 text: 20050929 day: 29 |
PublicationDecade | 2000 |
PublicationYear | 2005 |
RelatedCompanies | TEXAS INSTRUMENTS INCORPORATED |
RelatedCompanies_xml | – name: TEXAS INSTRUMENTS INCORPORATED |
Score | 2.62832 |
Snippet | The present invention provides a tri-gate lower power device and method for fabricating that tri-gate semiconductor device. The tri-gate device includes a... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | Tri-gate low power device and method for manufacturing the same |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050929&DB=EPODOC&locale=&CC=US&NR=2005215022A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bS8MwFD6MKeqbTsXLlIDSt-J0XWceynC9MIRdcK3sbbRNAoMtLWvH_r4ncdU97S0kcEgCX75zknznADxbViIUj5n0jSUYoMTcTNJ2yxQdm6kcP-LVVuLk4cgeRNbnrDOrwbLSwug8oVudHBERlSLeS31e5_-XWJ7-W1m8JAvsynpB6HhGFR0j_WEA7fUdfzL2xq7huk40NUZfegzZDRnrA2OlI3SkuwoP_ndf6VLyfVIJzuF4gvZkeQE1Lhtw6la11xpwMtw9eWNzh77iEnrheqHvw8gy25Jc1TcjjCuok1gy8lsMmqAXSlax3CjJgtYgEvTxSBGv-BU8BX7oDkycyfxv4fNouj_t9jXUZSb5DRAEHkc4CpsKCz2ulFJuU9Z-Z5ZgtMtat9A8ZOnu8PA9nOkEperthTahXq43_AGpt0we9Y79AK_khrA |
link.rule.ids | 230,309,783,888,25576,76876 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3fT8IwEL4QNOKbosYfqE00e1tEN4Z9WIjsR1DZILIZ3paNdgkJbAuM8O97raA88da0yaVt8vW7a_vdATzqepIKHlPpC0swQIm5mky0ppq2DCZy_KTPhhAne77RC_WPcWtcgdlWCyPzhK5lckRE1ATxXsrzuvi_xLLl38rlUzLFrrzjBqatbKNjpD8MoO2u6QwH9sBSLMsMR4r_JceQ3ZCx3jBWOkAnuy3w4Hx3hS6l2CUV9wQOh2gvK0-hwrM61Kxt7bU6HHmbJ29sbtC3PINOsJjK-zAyy9ekEPXNCOMC6iTOGPktBk3QCyXzOFsJyYLUIBL08cgynvNzeHCdwOqpOJPob-FRONqdtnYB1SzP-CUQBB5HOKYGTXX0uCaUcoMy7ZXpKaNt1ryCxj5L1_uH76HWC7x-1H_3P2_gWCYrFe8wtAHVcrHit0jDZXInd-8HLFmJow |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Tri-gate+low+power+device+and+method+for+manufacturing+the+same&rft.inventor=BREASHEARS+EDDIE+H&rft.inventor=ADAM+LAHIR+S&rft.inventor=TSAO+ALWIN+J&rft.date=2005-09-29&rft.externalDBID=A1&rft.externalDocID=US2005215022A1 |