Single electron memory device comprising quantum dots between gate electrode and single electron storage element and method for manufacturing the same

A single electron memory device including quantum dots between a gate electrode and a single electron storage element and a method for manufacturing the same, wherein the single electron memory device includes a substrate on which a nano-scale channel region is formed between a source and a drain, a...

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Bibliographic Details
Main Authors RYU WON-IL, KIM BYONG-MAN, CHAE SOO-DOO, KIM MOON-KYUNG, CHAE HEE-SOON
Format Patent
LanguageEnglish
Published 14.11.2002
Edition7
Subjects
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Summary:A single electron memory device including quantum dots between a gate electrode and a single electron storage element and a method for manufacturing the same, wherein the single electron memory device includes a substrate on which a nano-scale channel region is formed between a source and a drain, and a gate lamination pattern including quantum dots on the channel region. The gate lamination pattern includes a lower layer formed on the channel region, a single electron storage medium storing a single electron tunneling through the lower layer formed on the lower layer, an upper layer including quantum dots formed on the single electron storage medium, and a gate electrode formed on the upper layer to be in contact with the quantum dots.
Bibliography:Application Number: US20020125597