Utensil for evaluating length measurement error in X-ray CT device for three-dimensional shape measurement
In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arrang...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
04.06.2024
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Subjects | |
Online Access | Get full text |
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