Utensil for evaluating length measurement error in X-ray CT device for three-dimensional shape measurement

In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arrang...

Full description

Saved in:
Bibliographic Details
Main Authors Abe, Makoto, Kishi, Taketo, Takatsuji, Toshiyuki, Fujimoto, Hiroyuki, Sato, Makoto
Format Patent
LanguageEnglish
Published 04.06.2024
Subjects
DIAGNOSIS
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
MEDICAL OR VETERINARY SCIENCE
SURGERY
Online AccessGet full text

Cover

Abstract In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arranged in an XYZ space on the base. On a flat surface on the top of the base, the support rods supporting the spheres and having different lengths are arranged at predetermined intervals. In doing so, the spheres are arranged in the XYZ space respectively at appropriate inter-sphere distances.
AbstractList In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arranged in an XYZ space on the base. On a flat surface on the top of the base, the support rods supporting the spheres and having different lengths are arranged at predetermined intervals. In doing so, the spheres are arranged in the XYZ space respectively at appropriate inter-sphere distances.
Author Takatsuji, Toshiyuki
Kishi, Taketo
Fujimoto, Hiroyuki
Abe, Makoto
Sato, Makoto
Author_xml – fullname: Abe, Makoto
– fullname: Kishi, Taketo
– fullname: Takatsuji, Toshiyuki
– fullname: Fujimoto, Hiroyuki
– fullname: Sato, Makoto
BookMark eNqNjLsOgkAUBbfQwtc_XD-AAmiklWjshcSO3MAB1ix3ye5C4t_7iIWl1TQzs1YLsYKVupcB4rWh1jrCzGbioKUjA-lCTwPYTw4DJBCcezla6BY5flBeUINZ1_ikoXdA1OjhfbPChnzPI34HW7Vs2Xjsvtyo_flU5JcIo63gR64hCFV5jeMsO6SH5Jik_zhP_UNDJw
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID US11998382B2
GroupedDBID EVB
ID FETCH-epo_espacenet_US11998382B23
IEDL.DBID EVB
IngestDate Fri Aug 02 09:00:42 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US11998382B23
Notes Application Number: US202217678726
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240604&DB=EPODOC&CC=US&NR=11998382B2
ParticipantIDs epo_espacenet_US11998382B2
PublicationCentury 2000
PublicationDate 20240604
PublicationDateYYYYMMDD 2024-06-04
PublicationDate_xml – month: 06
  year: 2024
  text: 20240604
  day: 04
PublicationDecade 2020
PublicationYear 2024
RelatedCompanies Shimadzu Corporation
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
RelatedCompanies_xml – name: Shimadzu Corporation
– name: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Score 3.5391603
Snippet In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray...
SourceID epo
SourceType Open Access Repository
SubjectTerms DIAGNOSIS
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
MEDICAL OR VETERINARY SCIENCE
SURGERY
Title Utensil for evaluating length measurement error in X-ray CT device for three-dimensional shape measurement
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240604&DB=EPODOC&locale=&CC=US&NR=11998382B2
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFPVNp6LzgwjSt6Bda9M9FKHtxhD2gVtlb6NrMrehXWkr4n_vJbZ2L_oW8nGkF-4j6d3vAG6N0GTWoqVTS7CImsJuU1vwkEZovXTBGTNU9Yb-wOoF5tP0YVqDdZkLo3BCPxU4IkpUhPKeK32dVI9YvoqtzO7mK-zaPHYnjq8Vt2NpnvDQfdfpjIb-0NM8zwnG2uDZ0WUumWG3XFTXO-hGMykNnRdXZqUk2yalewi7I6QW50dQE3ED9r2y8loD9vrFD29sFrKXHcM6UMHmbwTdTFKCdMevRJZCyZfkvXrsIyJNcc4qJlOahl_EmxAupEZQS3M8PUG5RPX_QeQg2TJMxDaBE7jpdiZej-KmZ78cmgXj6vuMU6jHm1icAWFhGEmwmxZnttk2zDlneoQeGL-3ogVenc6h-Ted5n-DF3Agua1ipsxLqOfph7hC65zPrxVbvwEjfpXn
link.rule.ids 230,309,783,888,25576,76882
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8QNOKbokbxqyaGt0bH5joeFhM2CCpfkc3sjYy1CETHss0Y_3uvFYQXfVu29rJecx-93v0O4FoPDWZOaho1BYuoIaw6tQQPaYTWSxOcMV11b-j2zLZvPAZ3QQHmq1oYhRP6qcARUaIilPdc6etkHcRyVW5ldjOe4avFfcuz3erydCzNE26627Cbg77bd6qOY_vDau_Z1mQtmW7VGqiut9DFtmS3g-ZLQ1alJJsmpbUH2wOkFuf7UBBxGUrOqvNaGXa6ywtvfFzKXnYAc18lm78RdDPJCqQ7fiWyFUo-Je_rYB8RaYpjZjEJaBp-EccjXEiNoKbmuHuCconq_4PIQbJpmIhNAodw1Wp6TpviT49-OTTyh-v16UdQjBexOAbCwjCSYDc1ziyjrhtjzrQIPTB-a0YTPDqdQOVvOpX_Pl5Cqe11O6POQ-_pFHYl51X-lHEGxTz9EOdoqfPxhWLxN1QDmNc
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Utensil+for+evaluating+length+measurement+error+in+X-ray+CT+device+for+three-dimensional+shape+measurement&rft.inventor=Abe%2C+Makoto&rft.inventor=Kishi%2C+Taketo&rft.inventor=Takatsuji%2C+Toshiyuki&rft.inventor=Fujimoto%2C+Hiroyuki&rft.inventor=Sato%2C+Makoto&rft.date=2024-06-04&rft.externalDBID=B2&rft.externalDocID=US11998382B2