Three-dimensional shape measuring method and three-dimensional shape measuring device

• Main Authors: Hasegawa, Hiroshi, Horiguchi, Hirosada, Narimatsu, Shuji
• Format: Patent
• Language: English
• Published: 20.02.2024
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; PICTORIAL COMMUNICATION, e.g. TELEVISION; TESTING

A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a first full pattern based on a second light onto a target object, the first light and the second light being lights of two colors included in three primary colors of light; picking up, by a three-color camera, an image of the first grid pattern and the first full pattern projected on the target object, and acquiring a first picked-up image based on the first light and a second picked-up image based on the second light; and calculating height information of the target object, using the first picked-up image, and calculating position information of the target object, using the second picked-up image.