Three-dimensional shape measuring method and three-dimensional shape measuring device

A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a first full pattern based on a second light onto a target object, the first light and the second light being lights of two colors included in three primary colors of light; picking up, by...

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Bibliographic Details
Main Authors Hasegawa, Hiroshi, Horiguchi, Hirosada, Narimatsu, Shuji
Format Patent
LanguageEnglish
Published 20.02.2024
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
TESTING
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Summary:A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a first full pattern based on a second light onto a target object, the first light and the second light being lights of two colors included in three primary colors of light; picking up, by a three-color camera, an image of the first grid pattern and the first full pattern projected on the target object, and acquiring a first picked-up image based on the first light and a second picked-up image based on the second light; and calculating height information of the target object, using the first picked-up image, and calculating position information of the target object, using the second picked-up image.
Bibliography:Application Number: US202117475387