Device and method for controlled emission of radiation

• Main Authors: Lavania, Anupam, Malik, Shilpa
• Format: Patent
• Language: English
• Published: 16.01.2024
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

Embodiments of present disclosure relates to method and device for controlled emission of radiation. Device comprises probe unit, sensor unit and switch unit. Probe unit is configured to emit radiation on surface of object. Probe unit is supported, via an elastic, to supporting structure of device. Sensor unit is placed at predefined distance from probe unit, along supporting structure, to establish contact with surface. Sensor unit comprises flexible material, mounted to supporting structure, with cavity and first force sensing unit placed in cavity of flexible material. First force sensing unit is configured to detect first force transferred from surface sensor unit. Switch unit is configured to control emission of radiation on surface, based on first force detected by first force sensing unit, upon contact of sensor unit with surface and identification of probe unit to be one of in contact with surface or at minimal distance from surface.