Eight-transistor static random access memory, layout thereof, and method for manufacturing the same

A Static Random Access Memory (SRAM) cell includes a write port including a first inverter including a first pull-up transistor and a first pull-down transistor, and a second inverter including a second pull-up transistor and a second pull-down transistor and cross-coupled with the first inverter; a...

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Main Authors Hu, Yao-Chung, Lo, Kuo-Hung, Chang, Hao, Li, Kun-Hsi, Lu, Shau-Wei, Hsu, Kang-Yu
Format Patent
LanguageEnglish
Published 28.11.2023
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Abstract A Static Random Access Memory (SRAM) cell includes a write port including a first inverter including a first pull-up transistor and a first pull-down transistor, and a second inverter including a second pull-up transistor and a second pull-down transistor and cross-coupled with the first inverter; and a read port including a read pass-gate transistor and a read pull-down transistor serially connected to each. A first doped concentration of impurities doped in channel regions of the second pull-down transistor and the read pull-down transistor is greater than a second doped concentration of the impurities doped in a channel region of the first pull-down transistor, or the impurities are doped in the channel regions of the second pull-down transistor and the read pull-down transistor and are not doped in the channel region of the first pull-down transistor.
AbstractList A Static Random Access Memory (SRAM) cell includes a write port including a first inverter including a first pull-up transistor and a first pull-down transistor, and a second inverter including a second pull-up transistor and a second pull-down transistor and cross-coupled with the first inverter; and a read port including a read pass-gate transistor and a read pull-down transistor serially connected to each. A first doped concentration of impurities doped in channel regions of the second pull-down transistor and the read pull-down transistor is greater than a second doped concentration of the impurities doped in a channel region of the first pull-down transistor, or the impurities are doped in the channel regions of the second pull-down transistor and the read pull-down transistor and are not doped in the channel region of the first pull-down transistor.
Author Hu, Yao-Chung
Lu, Shau-Wei
Chang, Hao
Lo, Kuo-Hung
Li, Kun-Hsi
Hsu, Kang-Yu
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– fullname: Hsu, Kang-Yu
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TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD
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Snippet A Static Random Access Memory (SRAM) cell includes a write port including a first inverter including a first pull-up transistor and a first pull-down...
SourceID epo
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SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title Eight-transistor static random access memory, layout thereof, and method for manufacturing the same
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