Histogram bin interval approximation

• Main Authors: Kaufmann, Malte Christian, O'Hara, Paul, Ortiz, Esther Rodrigo, White, Conor
• Format: Patent
• Language: English
• Published: 22.08.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

Using approximated bin intervals to label the histograms provides clarity and allows for the histogram to be more intuitively understood. A dataset may comprise a plurality of records having a plurality of features including one or more continuous features. A selection of a continuous feature may be obtained. A bin width based on a number of bins and feature statistics of the continuous feature may be determined. An approximated bin interval range is determined by applying a bin mask based on the bin width to the feature statistics. An approximated bin width is determined based on the number of bins and the approximated bin interval range. Approximated bin intervals for the histogram are determined based on the approximated bin width. A histogram is generated having bins with intervals based the approximated bin intervals.