Workload instrument masking

A method to optimize analyzer use in a laboratory having a plurality of analyzers based on laboratory workload is presented. The method comprises determining current laboratory workload, calculating workload capability of the plurality of analyzers minus one analyzer if the current laboratory worklo...

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Bibliographic Details
Main Author Maetzler, Marco
Format Patent
LanguageEnglish
Published 22.08.2023
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A method to optimize analyzer use in a laboratory having a plurality of analyzers based on laboratory workload is presented. The method comprises determining current laboratory workload, calculating workload capability of the plurality of analyzers minus one analyzer if the current laboratory workload is below a threshold criteria and if there are two or more analyzers in the plurality of analyzers, masking one of the plurality of analyzers if the current workload is met by the plurality of analyzers minus one analyzer, proceeding with current workload, and repeating the above steps until the current laboratory workload has been completed.
Bibliography:Application Number: US202017119307