In-situ tensile device for X-ray tests

• Main Authors: Huang, Mingdong, Dong, Xueguang, Fan, Ronghui, Wang, Junqiang, Wang, Guojun
• Format: Patent
• Language: English
• Published: 18.07.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

An in-situ tensile device for X-ray tests is provided, including: a frame including a connecting structure, where the connecting structure is configured to fixedly connect to a testing bench of a testing device; a stretching mechanism, disposed on the frame; a clamping mechanism, including two clamping assemblies arranged opposite to each other in a length direction; where the two clamping assemblies are configured to clamp two ends of a testing piece, the testing piece is provided with a testing surface, and the testing surface is disposed on surfaces of the two clamping assemblies; the stretching mechanism is drivingly connected to the two clamping assemblies to enable the two clamping assemblies to move synchronously in one of a direction approaching each other and a direction far away from each other; and the two clamping assemblies are detachably connected to the stretching mechanism. The device can improve the accuracy of test results.