Probe assembly with two spaced probes for high frequency circuit board test apparatus
The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of moving in X, Y and Z directions relative to a circuit board being tested (UUT). The two test probes are movable linearly relative to each other...
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| Main Authors | , |
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| Format | Patent |
| Language | English |
| Published |
13.06.2023
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| Subjects | |
| Online Access | Get full text |
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| Abstract | The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of moving in X, Y and Z directions relative to a circuit board being tested (UUT). The two test probes are movable linearly relative to each other and rotatable together so as to accurately locate the two probes on selected pins on the UUT, for receiving signals from the selected pins, The received signals are transmitted to a display apparatus. |
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| AbstractList | The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of moving in X, Y and Z directions relative to a circuit board being tested (UUT). The two test probes are movable linearly relative to each other and rotatable together so as to accurately locate the two probes on selected pins on the UUT, for receiving signals from the selected pins, The received signals are transmitted to a display apparatus. |
| Author | Howard, Alan Grams, Bradley D |
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| Notes | Application Number: US202117504825 |
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| PublicationDateYYYYMMDD | 2023-06-13 |
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| PublicationYear | 2023 |
| RelatedCompanies | HUNTRON, INC |
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| Snippet | The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of... |
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| SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| Title | Probe assembly with two spaced probes for high frequency circuit board test apparatus |
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