Test socket and test apparatus having the same, manufacturing method for the test socket
The present invention relates to a test socket configured to electrically connect a tester generating a test signal and a device under inspection to each other includes a nonelastic electrically-conductive housing having a plurality of housing holes passing therethrough in a thickness direction, an...
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| Main Authors | , |
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| Format | Patent |
| Language | English |
| Published |
14.12.2021
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| Subjects | |
| Online Access | Get full text |
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| Abstract | The present invention relates to a test socket configured to electrically connect a tester generating a test signal and a device under inspection to each other includes a nonelastic electrically-conductive housing having a plurality of housing holes passing therethrough in a thickness direction, an insulating coating layer applied on at least an upper surface of the nonelastic electrically-conductive housing and a circumference of each of the plurality of housing hole, and an electrically-conductive part formed to have a configuration in which a plurality of electrically-conductive particles are contained in an elastic insulating material, disposed in the housing hole such that a lower end portion thereof may be connected to a signal electrode of the tester placed below the nonelastic electrically-conductive housing. |
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| AbstractList | The present invention relates to a test socket configured to electrically connect a tester generating a test signal and a device under inspection to each other includes a nonelastic electrically-conductive housing having a plurality of housing holes passing therethrough in a thickness direction, an insulating coating layer applied on at least an upper surface of the nonelastic electrically-conductive housing and a circumference of each of the plurality of housing hole, and an electrically-conductive part formed to have a configuration in which a plurality of electrically-conductive particles are contained in an elastic insulating material, disposed in the housing hole such that a lower end portion thereof may be connected to a signal electrode of the tester placed below the nonelastic electrically-conductive housing. |
| Author | Oh, Chang Su Kim, Bo Hyun |
| Author_xml | – fullname: Kim, Bo Hyun – fullname: Oh, Chang Su |
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| Notes | Application Number: US202117204186 |
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| PublicationYear | 2021 |
| RelatedCompanies | TSE CO., LTD |
| RelatedCompanies_xml | – name: TSE CO., LTD |
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| Snippet | The present invention relates to a test socket configured to electrically connect a tester generating a test signal and a device under inspection to each other... |
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| SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| Title | Test socket and test apparatus having the same, manufacturing method for the test socket |
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