Automated analyzer and automated analysis method
The present invention makes it possible for an automated analyzer including two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. T...
Saved in:
Main Authors | , , , |
---|---|
Format | Patent |
Language | English |
Published |
30.11.2021
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | The present invention makes it possible for an automated analyzer including two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. This automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results. |
---|---|
AbstractList | The present invention makes it possible for an automated analyzer including two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. This automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results. |
Author | Iijima, Masahiko Kogure, Kenji Kazama, Yuto Yabutani, Chie |
Author_xml | – fullname: Kazama, Yuto – fullname: Kogure, Kenji – fullname: Iijima, Masahiko – fullname: Yabutani, Chie |
BookMark | eNrjYmDJy89L5WQwcCwtyc9NLElNUUjMS8yprEotAjKAHFTh4sxihdzUkoz8FB4G1rTEnOJUXijNzaDo5hri7KGbWpAfn1pckJicmpdaEh8abGhoaGFubmjkZGRMjBoAgPothw |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
ExternalDocumentID | US11187712B2 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US11187712B23 |
IEDL.DBID | EVB |
IngestDate | Fri Aug 30 05:42:25 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US11187712B23 |
Notes | Application Number: US201816646386 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211130&DB=EPODOC&CC=US&NR=11187712B2 |
ParticipantIDs | epo_espacenet_US11187712B2 |
PublicationCentury | 2000 |
PublicationDate | 20211130 |
PublicationDateYYYYMMDD | 2021-11-30 |
PublicationDate_xml | – month: 11 year: 2021 text: 20211130 day: 30 |
PublicationDecade | 2020 |
PublicationYear | 2021 |
RelatedCompanies | Hitachi High-Technologies Corporation |
RelatedCompanies_xml | – name: Hitachi High-Technologies Corporation |
Score | 3.373081 |
Snippet | The present invention makes it possible for an automated analyzer including two or more types of photometers to obtain suitable output of the measurement... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
Title | Automated analyzer and automated analysis method |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211130&DB=EPODOC&locale=&CC=US&NR=11187712B2 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_G_HzTquj8oIL0rdit3w9F7BdDcBtulb2NNklhe2jH2iH413vJOqcP-pZcICRH7iO5y-8AHkzmGtQ0dTUl1FINPSOqY-lUzU1H6xE8ECQXaJ8Dq58YL1Nz2oLF9i-MwAn9EOCIKFEE5b0W-nq5e8QKRW5l9ZjNkVQ-xRMvVJrbcY8XTteU0Pei0TAcBkoQeMlYGbx5XV5W2-72fFTXe-hG2zz9K3r3-a-U5U-TEp_A_ghnK-pTaLFCgqNgW3lNgsPXJuAtwYHI0CQVEhsprM5Ae17XJXqajMopxxT5ZCtsYOc3uZpX8qZA9Dncx9Ek6Ku4iNn3jmfJeLde_QLaRVmwS5BdysOCjktpnhrUIqmZ2hlBF4qRDBUXvYLO3_N0_hu8hmPOvQ2m4Q2069Wa3aK1rbM7waYvVX6ESw |
link.rule.ids | 230,309,783,888,25578,76884 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMU21NEkxNTXWTUxOMdM1MU5K1rUwM07RTTO1MDBKBiaI5DTwaZ9-Zh6hJl4RphFMDFmwvTDgc0LLwYcjAnNUMjC_l4DL6wLEIJYLeG1lsX5SJlAo394txNZFDdo7NgJdnG6g5uJk6xrg7-LvrObsbBsarOYXZGsIulbb3NDICVhcswKb2Bagc_Zdw5xAu1IKkKsUN0EGtgCgaXklQgxMqXnCDJzOsJvXhBk4fKET3sIM7OAVmsnFQEFoLiwWYTBwLC3JB7Y0U1MUEkFnilSlFgEZQA6qcHFmsQLkgmhRBkU31xBnD12gI-LhPo4PDUa411iMgSUvPy9VgkHBMgU0LWhhmZKSlmiSYpacaJponpQMbEKlJicBC64USQYp3OZI4ZOUZ-D0CPH1iffx9POWZuAChSTkfEMZBpaSotJUWWDNW5IkBw4yALHkhzs |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Automated+analyzer+and+automated+analysis+method&rft.inventor=Kazama%2C+Yuto&rft.inventor=Kogure%2C+Kenji&rft.inventor=Iijima%2C+Masahiko&rft.inventor=Yabutani%2C+Chie&rft.date=2021-11-30&rft.externalDBID=B2&rft.externalDocID=US11187712B2 |