Apparatus and method for testing a circuit

• Main Authors: Markwirth, Thomas, Gerth, Stephan, Einwich, Karsten
• Format: Patent
• Language: English
• Published: 01.09.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention refers to an apparatus for testing a circuit, including: an interrupter configured for interrupting based on a circuit model describing at least a part of the circuit a connection between two components of the circuit, wherein the circuit model describes the two components connected by...