Cognitive testing configuration according to dynamic changes in an install-base

In a workload data, a pattern of usage of an aspect of a product is detected in a production system. The pattern is apportioned into a portion. When a test has a characterization that corresponds to the portion within a tolerance, the test is configured in a test bucket. The product is caused to be...

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Bibliographic Details
Main Authors Cazarez Aguilar, Josue, Robison, Micah
Format Patent
LanguageEnglish
Published 17.03.2020
Subjects
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:In a workload data, a pattern of usage of an aspect of a product is detected in a production system. The pattern is apportioned into a portion. When a test has a characterization that corresponds to the portion within a tolerance, the test is configured in a test bucket. The product is caused to be tested using the test bucket, the test bucket including a set of tests such that the set of tests collectively correspond to the pattern within the tolerance.
Bibliography:Application Number: US201815935221