Method and apparatus for dynamic calibration of on-die-precision-resistors

• Main Authors: Gada, Sridhar V, Arora, Sonu
• Format: Patent
• Language: English
• Published: 04.12.2018
• Subjects: BASIC ELECTRIC ELEMENTS; BASIC ELECTRONIC CIRCUITRY; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; INFORMATION STORAGE; PHYSICS; PULSE TECHNIQUE; RESONATORS; SEMICONDUCTOR DEVICES; STATIC STORES

Various on-die-precision-resistor arrays, and methods of making and calibrating the same are disclosed. In one aspect, an apparatus is provided that includes a semiconductor chip and a precision resistor array on the semiconductor chip. A replica precision resistor array is on the semiconductor chip. The replica precision resistor array is configured to mimic the resistance behavior of the precision resistor array and has a characteristic resistance that is a function of temperature. The semiconductor chip is configured to calibrate the precision resistor array using the characterized resistance as a function of temperature, a resistance offset of the precision resistor array relative to the characterized resistance as a function of temperature, and a temperature of the precision resistor array.