Method and apparatus for dynamic calibration of on-die-precision-resistors

Various on-die-precision-resistor arrays, and methods of making and calibrating the same are disclosed. In one aspect, an apparatus is provided that includes a semiconductor chip and a precision resistor array on the semiconductor chip. A replica precision resistor array is on the semiconductor chip...

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Bibliographic Details
Main Authors Gada, Sridhar V, Arora, Sonu
Format Patent
LanguageEnglish
Published 04.12.2018
Subjects
BASIC ELECTRIC ELEMENTS
BASIC ELECTRONIC CIRCUITRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS
INFORMATION STORAGE
PHYSICS
PULSE TECHNIQUE
RESONATORS
SEMICONDUCTOR DEVICES
STATIC STORES
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Summary:Various on-die-precision-resistor arrays, and methods of making and calibrating the same are disclosed. In one aspect, an apparatus is provided that includes a semiconductor chip and a precision resistor array on the semiconductor chip. A replica precision resistor array is on the semiconductor chip. The replica precision resistor array is configured to mimic the resistance behavior of the precision resistor array and has a characteristic resistance that is a function of temperature. The semiconductor chip is configured to calibrate the precision resistor array using the characterized resistance as a function of temperature, a resistance offset of the precision resistor array relative to the characterized resistance as a function of temperature, and a temperature of the precision resistor array.
Bibliography:Application Number: US201715847996