Three-dimensional memory device having conductive support structures and method of making thereof

An alternating stack of insulating layers and sacrificial material layers is formed over a horizontal layer, which can be formed over a lower-interconnect-level dielectric material layer overlying a substrate. Structural integrity of insulating layers vertically spaced from one another by backside r...

Full description

Saved in:
Bibliographic Details
Main Authors Ogawa, Hiroyuki, Masamori, Yohei
Format Patent
LanguageEnglish
Published 30.10.2018
Subjects
Online AccessGet full text

Cover

Loading…
Abstract An alternating stack of insulating layers and sacrificial material layers is formed over a horizontal layer, which can be formed over a lower-interconnect-level dielectric material layer overlying a substrate. Structural integrity of insulating layers vertically spaced from one another by backside recesses during replacement of sacrificial material layers with electrically conductive layers can be enhanced by forming electrically inactive laterally-insulated support structures concurrently with formation of laterally-insulated conductive via structures that vertically extend through each layer in the alternating stack and through the horizontal layer and to lower-interconnect-level metal interconnect structures. Alternatively or additionally, the structural integrity of insulating layers during the replacement process can be enhanced by M×N array of semiconductor-containing support structures that extend through staircase region and having same materials as memory stack structures.
AbstractList An alternating stack of insulating layers and sacrificial material layers is formed over a horizontal layer, which can be formed over a lower-interconnect-level dielectric material layer overlying a substrate. Structural integrity of insulating layers vertically spaced from one another by backside recesses during replacement of sacrificial material layers with electrically conductive layers can be enhanced by forming electrically inactive laterally-insulated support structures concurrently with formation of laterally-insulated conductive via structures that vertically extend through each layer in the alternating stack and through the horizontal layer and to lower-interconnect-level metal interconnect structures. Alternatively or additionally, the structural integrity of insulating layers during the replacement process can be enhanced by M×N array of semiconductor-containing support structures that extend through staircase region and having same materials as memory stack structures.
Author Masamori, Yohei
Ogawa, Hiroyuki
Author_xml – fullname: Ogawa, Hiroyuki
– fullname: Masamori, Yohei
BookMark eNqNi00KwjAUBrPQhX93eB6gYCx6AEVxb12XkHw1wSYvJGnB21vBA7gaGGaWYhY4YCFUYxNQGecRsuOgevLwnN5kMDoNsmp04Umagxl0cSMoDzFyKpRLmsyQkEkFM23FsiHuyKvXdykWCdytxbxTfcbmx5XYXi_N-VYhcosclUZAaR93uZPycKz3J1n_03wA1rtAXg
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID US10115632B1
GroupedDBID EVB
ID FETCH-epo_espacenet_US10115632B13
IEDL.DBID EVB
IngestDate Fri Aug 23 06:56:53 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US10115632B13
Notes Application Number: US201715489050
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181030&DB=EPODOC&CC=US&NR=10115632B1
ParticipantIDs epo_espacenet_US10115632B1
PublicationCentury 2000
PublicationDate 20181030
PublicationDateYYYYMMDD 2018-10-30
PublicationDate_xml – month: 10
  year: 2018
  text: 20181030
  day: 30
PublicationDecade 2010
PublicationYear 2018
RelatedCompanies SANDISK TECHNOLOGIES LLC
RelatedCompanies_xml – name: SANDISK TECHNOLOGIES LLC
Score 3.177228
Snippet An alternating stack of insulating layers and sacrificial material layers is formed over a horizontal layer, which can be formed over a...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title Three-dimensional memory device having conductive support structures and method of making thereof
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181030&DB=EPODOC&locale=&CC=US&NR=10115632B1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5KFfWmVdH6YAXJLZikSdMeitA8KEIf2ER6K9nubFFoUkiL-O-d3bbWi95CAstm2Jn5JpnvG4BHzn1LCNs1Wy2cma4jXTPDtm1ihnp6dKOl6dH9QbOXui8Tb1KBjx0XRuuEfmpxRPKoGfn7Ssfr5f4jVqh7K8sn_k63iuc46YTGtjqmdEWH1gi7nWg0DIeBEQSddGwMXgnrEvRpNpwuVUoHBKN91f4VvXUVK2X5O6XEp3A4otXy1RlUMK_BcbCbvFaDo_72hzddbn2vPIcsIbOjKZQc_0ZKgy1Um-wXE6jcnSm-fT5nVOAqDVeKYqxcLxW8ZhuR2DVV1izLBdtMjWaFZAs9i4opEIiFvICHOEqCnkl7nf4YZpqO96_VuIRqXuR4BQyF5aB0JBe2YoxnvO16si2k5_uZ76G8hvrf69T_e3gDJ8rIOnZbt1Cl3eMdJeUVv9fW_AZ-2pQQ
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1NT8JAEJ0QNOJNUSP4tSamt8ZSWloOxIQWggqFSGu4kZadNZrQkgAx_ntntyBe9NZsk83uZGfmTbvvDcBdkjgG5zVLd12c6ZYpLD3GZk3HGFX36Lqr6NGDoNGLrKeJPSnAx5YLo3RCP5U4InnUjPx9peL1YvcRy1d3K5f3yTsNZQ_dsOVrm-qY0hUdWs1vtzqjoT_0NM9rRWMteCGsS9CnUTfbVCntEcR2pc5-57UtWSmL3ymlewT7I5otXR1DAdMylLxt57UyHAw2P7zpceN7yxOIQzI76lzK8edSGmwur8l-MY7S3Znk26dvjApcqeFKUYwt1wsJr1kuErumyprFKWd512iWCTZXvaiYBIGYiVO47XZCr6fTWqc_hplG49226mdQTLMUz4EhN0wUpkh4TTLG46Rp2aLJhe04sWOjqED173mq_728gVIvHPSn_cfg-QIOpcFVHDcuoUg7wStK0KvkWln2G5k5lwA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Three-dimensional+memory+device+having+conductive+support+structures+and+method+of+making+thereof&rft.inventor=Ogawa%2C+Hiroyuki&rft.inventor=Masamori%2C+Yohei&rft.date=2018-10-30&rft.externalDBID=B1&rft.externalDocID=US10115632B1